Abstract

One of the primary challenges in advanced manufacturing (AM) is the lack of efficient optical metrics for ensuring quality control over the manufacturing process. Many current imaging techniques have excessive data requirements and require computationally intensive post-processing to effectively characterize various AM environments. Spatial frequency modulated imaging (SPIFI) addresses many of these issues with the following benefits: it is compatible with long working distance optics, provides a large field-of-view, features single element detection, and can provide enhanced resolution. Here, we demonstrate SPIFI with enhanced resolution in multiple dimensions for the first time. This is achieved by incorporating multiple linear extended excitation sources oriented with axes at arbitrary angles with respect to each other. The system utilizes a single modulation mask enabling facile implementation within existing imaging systems such as those found in laser AM systems.

摘要

先进制造（AM）的主要挑战之一是缺乏有效的光学指标来确保对制造过程的质量控制。当前许多成像技术对数据的要求都过高，需要大量计算后处理才能有效地表征各种AM环境。空间频率调制成像（SPIFI）解决了许多这些问题，并具有以下优点：它与长工作距离光学器件兼容，提供大视野，具有单元素检测功能，并且可以提供增强的分辨率。在这里，我们首次展示了在多个维度上具有增强分辨率的SPIFI。这可以通过合并多个线性扩展的激励源来实现，这些激励源的轴彼此之间以任意角度定向。