International Journal of Optomechatronics ( IF 5.5 ) Pub Date : 2022-05-04 , DOI: 10.1080/15599612.2022.2048151 Sanshuang Jin 1 , Yunkun Zhao 1 , Baogen Sun 1 , Leilei Tang 1 , Fangfang Wu 1 , Tianyu Zhou 1 , Ping Lu 1 , Jigang Wang 1
Abstract
In this paper, a horizontal and vertical double-slits interferometer using visible light are designed to measure the transverse beam size of Hefei Light Source II (HLS-II). For the given initial structural parameters of the two interferometers, a series of numerical simulations and analyses are carried out by using the Synchrotron Radiation Workshop (SRW) code. Furthermore, the core parameters of the double-slits components in the interferometers are optimized. In the end, the visibilities of the horizontal and vertical interferometer we designed are 0.345 and 0.548 respectively, which are in the range of 0.2–0.6. And simulation results meet the requirement of theoretical relative measurement error of less than 10%.
中文翻译:
HLS-II中横向光束尺寸测量干涉系统的设计
摘要
本文设计了一种利用可见光的水平和垂直双缝干涉仪来测量合肥光源二号(HLS-II)的横向光束尺寸。对于给定的两个干涉仪的初始结构参数,使用同步加速器辐射车间(SRW)代码进行了一系列数值模拟和分析。此外,对干涉仪中双缝元件的核心参数进行了优化。最终我们设计的水平和垂直干涉仪的能见度分别为0.345和0.548,在0.2-0.6的范围内。仿真结果满足理论相对测量误差小于10%的要求。