In this study, Polyvinyl alcohol (PVA) films were irradiated with hydrogen beam of fluence 8x10¹⁷, 16x10¹⁷, and 24x10¹⁷ ions/cm² using handmade cold beam ion source. The resulting changes in the structure characteristics and functional groups of irradiated PVA films were studied using XRD and FT-IR methods respectively. In addition, the optical band gaps and Urbach energies of untreated and irradiated PVA were calculated using Tauc’s equation. The tail is 1.29 eV for PVA, improved to 1.59 eV and 4.17 eV when PVA was exposed to 8x10¹⁷ and 24x10¹⁷ ions/cm², respectively. Furthermore, the parameters including refractive index, extinction coefficient, conductivities, and permittivity for untreated and treated samples have been calculated. Furthermore, the dispersion characteristics of un-irradiated and treated films are evaluated. With increasing hydrogen fluence of 8x10¹⁷ to 24x10¹⁷ ions/cm², the relaxation time is reduced from 2.75x10⁻¹⁴ sec to 0.045x10⁻¹⁴ sec. On the other hand, the optical susceptibility of pure and treated PVA has been calculated. The modification which induced in the optical characteristics of the irradiation films suggests these films to apply in a different uses like optoelectronics devices.

中文翻译：

---

改变氢束辐照柔性 PVA 聚合物薄膜的光学性能

在这项研究中，聚乙烯醇 (PVA) 薄膜使用手工制作的冷束离子源，用注量为 8x10 ¹⁷、16x10 17 和 24x10 ^17离子 /cm ^{2的氢束照射。}分别使用 XRD 和 FT-IR 方法研究了辐照 PVA 薄膜的结构特征和官能团的变化。此外，使用 Tauc 方程计算未处理和辐照 PVA 的光学带隙和 Urbach 能量。PVA 的尾部为 1.29 eV，当 PVA 暴露于 8x10 ¹⁷和 24x10 ¹⁷ 离子/cm ^{2时提高到 1.59 eV 和 4.17 eV}， 分别。此外，还计算了未处理和处理样品的折射率、消光系数、电导率和介电常数等参数。此外，评估了未辐照和处理过的薄膜的分散特性。随着8x10 ¹⁷的氢注量增加到24x10 ¹⁷ 离子/cm ²，弛豫时间从2.75x10 ^-14 秒减少到0.045x10 ^-14 秒。另一方面，计算了纯 PVA 和处理过的 PVA 的光学敏感性。辐照薄膜光学特性的改变表明这些薄膜可应用于不同的用途，如光电器件。