In this study, poly(vinyl alcohol) (PVA) films were irradiated with hydrogen beams with fluences of 8 × 10¹⁷, 16 × 10¹⁷ and 24 × 10¹⁷ ions/cm² using a handmade cold beam ion source. The resulting changes in the structural characteristics and functional groups of irradiated PVA films were studied using the X-ray diffraction and Fourier transform infrared spectroscopy methods, respectively. Besides, the optical bandgaps and Urbach energies of untreated and irradiated PVA were calculated using Tauc’s equation. The tail is 1.29 eV for PVA, which improved to 1.59 and 4.17 eV when PVA was exposed to 8 × 10¹⁷ and 24 × 10¹⁷ ions/cm² beams, respectively. Furthermore, the parameters of untreated and treated samples, including refractive index, extinction coefficient, conductivities and permittivity, were calculated. Furthermore, the dispersion characteristics of unirradiated and treated films were evaluated. With an increase in hydrogen fluence from 8 × 10¹⁷ to 24 × 10¹⁷ ions/cm², the relaxation time was reduced from 2.75 × 10⁻¹⁴ to 0.045 × 10⁻¹⁴ s. Moreover, the optical susceptibility of pure and treated PVA was calculated. The modification induced in the optical characteristics of the irradiated films suggests that these films can be applied in different uses such as in optoelectronic devices.

中文翻译：

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改变氢束辐照柔性 PVA 聚合物薄膜的光学性能

在这项研究中，使用手工制作的冷束离子源，用注量为 8 × 10 ¹⁷、16 × 10 ¹⁷和 24 × 10 ¹⁷ 离子/cm ²的氢束照射聚乙烯醇 (PVA) 薄膜。分别使用 X 射线衍射和傅里叶变换红外光谱方法研究了辐照 PVA 薄膜的结构特征和官能团的变化。此外，使用 Tauc 方程计算了未处理和辐照 PVA 的光学带隙和 Urbach 能量。PVA 的尾部为 1.29 eV，当 PVA 暴露于 8 × 10 ¹⁷和 24 × 10 ¹⁷ 离子/cm ^{2时，尾部提高到 1.59 和 4.17 eV}梁，分别。此外，还计算了未处理和处理过的样品的参数，包括折射率、消光系数、电导率和介电常数。此外，评估了未辐照和处理过的薄膜的分散特性。随着氢注量从 8 × 10 ¹⁷增加到 24 × 10 ¹⁷ 离子/cm ²，弛豫时间从 2.75 × 10 ^-14减少到 0.045 × 10 ^-14  s。此外，计算了纯 PVA 和处理过的 PVA 的光学敏感性。辐照薄膜的光学特性发生的变化表明，这些薄膜可以应用于不同的用途，例如光电设备。