X-ray diffraction in the Bragg-Brentano configuration (“XRD”) is a very established method. However, experimental evidence concerning its significant information depth, i.e. microstructure components from which maximum depth can affect the information evaluated from the acquired diffraction pattern, are scarce in the scientific literature. This depth is relevant to all XRD measurements performed on compact samples, especially layered composites and samples showing a crystallographic texture evolution. This article provides experimentally determined upper and lower limits to the significant information depth: XRD patterns acquired from a compact crystal layer through a layer of compact, amorphous glass indicate that the significant information depth of XRD using Cu Kα1 and Kα2 radiation is very likely larger than 48 μm, but smaller than 118 μm, in a material of the composition Mg2Al4Si5O18 with a density of ca. ~2.6 g/cm3. The depth of 48 μm correlates to the depth larger than the layer of material from which 90% of the reflected X-rays originate at 2Θ = 25.8°.

布拉格-布伦塔诺构型中的 X 射线衍射（“XRD”）是一种非常成熟的方法。然而，关于其重要信息深度的实验证据，即最大深度可以影响从所获取的衍射图案评估的信息的微观结构成分，在科学文献中很少。该深度与对致密样品进行的所有 XRD 测量相关，尤其是层状复合材料和显示晶体织构演变的样品。本文提供了通过实验确定的重要信息深度的上限和下限：从致密晶体层穿过致密非晶玻璃层获得的 XRD 图案表明，使用 Cu K α 1 和 K α 进行 XRD的重要信息深度在密度约为 Mg 2 Al 4 Si 5 O 18的成分材料中，2辐射很可能大于 48 μm，但小于 118 μm。〜2.6克/厘米3。48 μm 的深度与比 90% 的反射 X 射线源自 2θ = 25.8° 的材料层更大的深度相关。