This article proposes that we should think differently about predicting and interpreting measured field electron emission (FE) current–voltage [I_m(V_m)] characteristics. It is commonly assumed that I_m(V_m) data interpretation is a problem in emission physics and related electrostatics. Many experimentalists then apply the Fowler–Nordheim plot methodology, developed in 1929. However, with modern emitting materials, this 90-year-old interpretation methodology often fails (maybe in nearly 50% of cases) and yields spurious values for characterization parameters, particularly field enhancement factors. This has generated an unreliable literature. Hence, validity checks on experimental I_m(V_m) data are nearly always needed before use. A new check, supplementing existing checks, is described. Twelve different “system complications” that, acting singly or in combinations, can cause validity-check failure are identified. A top-level path forward from this unsatisfactory situation is proposed. The term “field electron emission system (FE system)” is defined to include all aspects of an experimental system that affect the measured I_m(V_m) characteristics. The analysis of FE systems should now be regarded as a specialized form of electronic/electrical engineering, provisionally called “FE Systems Engineering.” In this approach, the I_m(V_m) relationship is split as follows: (a) the current is expressed as a function I_m(F_C) of the local surface-field magnitude F_C at some defined emitter surface location “C,” and (b) the relationship between F_C and measured voltage V_m is expressed and determined separately. Determining I_m(F_C) is mostly a problem in emission physics. Determining the relationship F_C(V_m) depends on system electrostatics and (for systems failing a validity check) on the other aspects of FE Systems Engineering, in particular, electrical-circuit modeling. The scope of FE Systems Engineering and some related research implications and problems are outlined.

中文翻译：

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建议将场发射电流-电压特性的解释视为电气工程的一种特殊形式

本文建议我们应该以不同的方式思考预测和解释测量的场电子发射 (FE) 电流-电压 [ I _m ( V _m )] 特性。通常假设Im ( V _m ) 数据解释是发射物理学和相关静电学中的一个问题_。许多实验者随后应用了 1929 年开发的 Fowler-Nordheim 图方法。然而，对于现代发射材料，这种已有 90 年历史的解释方法经常失败（可能在近 50% 的情况下）并产生特征参数的虚假值，特别是场增强因子。这产生了不可靠的文献。因此，对实验的有效性检查I _m ( V _m ) 数据在使用前几乎总是需要的。描述了一种补充现有检查的新检查。确定了 12 种不同的“系统并发症”，它们单独或组合起作用时会导致有效性检查失败。提出了从这种令人不满意的情况中前进的顶级路径。术语“场电子发射系统（FE 系统）”被定义为包括影响测量的I _m ( V _m ) 特性的实验系统的所有方面。有限元系统的分析现在应被视为电子/电气工程的一种特殊形式，暂称为“有限元系统工程”。在这种方法中，我_m (V _m ) 关系拆分如下：(a) 电流表示为某个定义的发射表面位置“C”处的局部表面场大小F _C的函数I _m ( F _C ) ，以及 (b) 关系F _C和测量电压V _m之间的值分别表示和确定。确定I _m ( F _C ) 主要是发射物理学中的一个问题。确定关系F _C ( V _m) 取决于系统静电和（对于未通过有效性检查的系统）有限元系统工程的其他方面，特别是电路建模。概述了有限元系统工程的范围以及一些相关的研究意义和问题。