Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used widely throughout industrial and academic research due to the high information content of the chemically specific data it produces. Modern ToF-SIMS instruments can generate high mass resolution data that can be displayed as spectra and images (2D and 3D). This enables determining the distribution of molecules across and into a surface and provides access to information not obtainable from other methods. With this detailed chemical information comes a steep learning curve in how to properly acquire and interpret the data. This Tutorial is aimed at helping ToF-SIMS users to plan for and collect ToF-SIMS data. The second Tutorial in this series will cover how to process, display, and interpret ToF-SIMS data.

中文翻译：

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回到生物相关样品的飞行时间二次离子质谱分析的基础知识。I. 仪器仪表和数据收集。

飞行时间二次离子质谱法 (ToF-SIMS) 由于其产生的特定化学数据的信息含量高，在整个工业和学术研究中得到广泛应用。现代 ToF-SIMS 仪器可以生成可以显示为光谱和图像（2D 和 3D）的高质量分辨率数据。这使得能够确定分子在表面上和进入表面的分布，并提供对其他方法无法获得的信息的访问。有了这些详细的化学信息，如何正确获取和解释数据就会出现陡峭的学习曲线。本教程旨在帮助 ToF-SIMS 用户规划和收集 ToF-SIMS 数据。本系列的第二篇教程将介绍如何处理、显示和解释 ToF-SIMS 数据。