Electron beam irradiation (EBI) is now an effective and eco-friendly method to modify the properties of starch. In this study, wheat flour was irradiated at 10 MeV/up to 25 kGy of the electron beam, to analyze the effects of EBI on functional properties and the structure of wheat starch. The functional properties of wheat flour treated by EBI showed an increase in solubility from 15.19% to 50.48%, an increase in water/oil adsorption from 77.67% and 75% to 88.33% and 89.9%, and a decrease in swelling from 12.73 g/g to 5.98 g/g compared to the unirradiated wheat flour. EBI also decreased the rapidly digestible starch and therefore, increase the slowly digestible starch and resistant starch content. The structure of starch was characterized by scanning electron microscopy (SEM), polarized light microscopy (PLM), X-ray diffraction (XRD), and Fourier transform infrared spectroscopy (FTIR), indicating that the long-range crystal structure and short-range ordered structure of wheat starch by EBI decreased. Our results, therefore, may provide some detailed understanding of functional property changes of high starch-based foods by electron beam irradiation treatment technology.

电子束辐照 (EBI) 现在是一种有效且环保的改变淀粉特性的方法。在这项研究中，小麦面粉以 10 MeV/高达 25 kGy 的电子束进行辐照，以分析 EBI 对小麦淀粉功能特性和结构的影响。EBI 处理的小麦粉的功能特性显示溶解度从 15.19% 增加到 50.48%，水/油吸附从 77.67% 和 75% 增加到 88.33% 和 89.9%，溶胀度从 12.73 g// g 至 5.98 g/g 与未辐照小麦粉相比。EBI 还降低了快速消化淀粉，因此增加了缓慢消化淀粉和抗性淀粉的含量。通过扫描电子显微镜（SEM）、偏光显微镜（PLM）、X射线衍射（XRD）、和傅立叶变换红外光谱（FTIR），表明EBI处理的小麦淀粉的长程晶体结构和短程有序结构降低。因此，我们的结果可能会通过电子束辐照处理技术提供对高淀粉基食品功能特性变化的一些详细了解。