Nowadays, System on Chip (SOC) based devices such as smartphones, tablets, cameras, and others are commonly used. The cost of these devices is determined by the expenses associated with their manufacturing and testing. In modern manufacturing technology, SOC-based devices have more cores embedded within them. However, testing these numerous cores thoroughly can be quite expensive and can sometimes cost more than the manufacturing itself. To make these devices more affordable for people from economically weaker backgrounds, it is necessary to come up with an efficient testing strategy that can help reduce the costs. In this study, we introduce a new method of testing the SOC incompletely instead of testing it thoroughly. This method involves compromising on the test quality, which may result in errors in the output. Incomplete testing is performed only for those cores of the SOC that can tolerate such errors. For example, incomplete testing is performed for the cores that are responsible for multimedia applications such as image or video display, where a slight compromise in the quality can be tolerated by human eyes. This incomplete testing helps to reduce the Test Power Consumption (TP), Test Access Time (TAT), and Test Data Volume (TDV) while compromising with the Fault Coverage (FC).

如今，普遍使用基于片上系统 (SOC) 的设备，例如智能手机、平板电脑、相机等。这些设备的成本取决于与其制造和测试相关的费用。在现代制造技术中，基于 SOC 的设备中嵌入了更多内核。然而，彻底测试这些众多的内核可能会非常昂贵，有时甚至比制造本身的成本还要高。为了让经济背景较弱的人更能负担得起这些设备，有必要提出一种有助于降低成本的有效测试策略。在本研究中，我们介绍了一种不完全测试 SOC 而不是对其进行全面测试的新方法。此方法涉及对测试质量的妥协，这可能会导致输出错误。仅对可以容忍此类错误的 SOC 内核执行不完整测试。例如，对负责图像或视频显示等多媒体应用的核心进行了不完整的测试，这些核心在质量上的轻微妥协是人眼可以容忍的。这种不完整的测试有助于减少测试功耗(TP)、测试访问时间(TAT) 和测试数据量(TDV)，同时妥协故障覆盖率(FC)。