This work presents a study on the reliability of voters for approximate fault tolerant systems in the context of single event effects and electromagnetic interference. A first case study analyses different topologies of single-bit majority voters for logic circuits employing fault injection by simulation. In these simulations, an analysis is first performed to identify the critical diffusion areas of the physical implementation according to the voter input vector. Additionally, as a second case study, practical heavy ion experiments on different architectures of software-based approximate voters for mixed-signal applications are also presented, and the cross section of each voter is evaluated. The system comprising the voters was irradiated in two distinct experiments with an \(^{16}O\) ion beam, producing an effective LET at the active region of 5.5 MeV/mg/cm\(^2\). As a complementary study, a conducted electromagnetic interference injection was also performed, considering two distinct voting schemes. Results of the case-studies allow identifying the most tolerant voter architectures (among the studied ones) for approximate computing applications under single event effects and electromagnetic interference.

这项工作提出了在单事件效应和电磁干扰的背景下近似容错系统的选民可靠性的研究。第一个案例研究通过仿真分析了采用故障注入的逻辑电路的单位多数表决器的不同拓扑。在这些模拟中，首先进行分析，根据选民输入向量识别物理实现的关键扩散区域。此外，作为第二个案例研究，还介绍了针对混合信号应用的基于软件的近似投票器的不同架构的实际重离子实验，并对每个投票器的横截面进行了评估。包含选民的系统在两个不同的实验中受到了\(^{16}O\) 的辐射离子束，在 5.5 MeV/mg/cm \(^2\)的活性区域产生有效的 LET 。作为一项补充研究，考虑到两种不同的投票方案，还进行了电磁干扰注入。案例研究的结果允许识别单事件效应和电磁干扰下近似计算应用的最宽容的投票器架构（在所研究的架构中）。