The combination of complementary techniques for materials analysis can play a key role in both art conservation and academic research. Nowadays, the correlation of x-ray fluorescence (XRF) with hyperspectral reflectance imaging in the visible and infrared region has become a valuable tool for palette identification, painting techniques studies and for the diagnostic support dedicated to restoration and conservation. Moreover, both techniques enable researchers to reveal fascinating underpaintings, “pentimenti”, or even preparatory drawings offering new details on the creative process of the artist. This background has been a strong motivation for the development of a new multimodal tool for art and conservation: IRIS. IRIS is a mobile and reconfigurable scanner designed to address a wide range of demanding application, exploiting the opportunities given by simultaneous MA-XRF and hyperspectral reflectance scanning in the visible-near-infrared (VNIR) and short-wave-infrared (SWIR) range from 400 to 2500 nm. The system has been designed for in-situ, fast and non-invasive scanning of the sample without compromising spectral resolution and high throughput performance. The scanner acquires co-registered XRF/VNIR-SWIR data, thus allowing the user to obtain the maximum profit from their possible correlated information: the two techniques can provide enhanced or complementary information on the same spot of analysis with minimum effort in terms of data processing and no need for spatial alignment. In the present work, the qualitative and quantitative performance of IRIS are explored, together with the presentation of in-lab analysis on reference samples and a brief insight on a real case-study.

中文翻译：

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IRIS：一种新型集成仪器，用于联合注册 MA-XRF 测绘和 VNIR-SWIR 高光谱成像

材料分析互补技术的结合可以在艺术保护和学术研究中发挥关键作用。如今，X 射线荧光 (XRF) 与可见光和红外区域高光谱反射成像的相关性已成为调色板识别、绘画技术研究以及致力于修复和保护的诊断支持的宝贵工具。此外，这两种技术都使研究人员能够揭示迷人的底画、“pentimenti”，甚至是准备图，提供有关艺术家创作过程的新细节。这一背景是开发新的艺术和保护多模式工具：IRIS 的强大动力。IRIS 是一款移动式可重新配置扫描仪，旨在满足各种要求严格的应用，利用可见光-近红外 (VNIR) 和短波红外 (SWIR) 范围内同步 MA-XRF 和高光谱反射扫描带来的机会从 400 到 2500 nm。该系统设计用于对样品进行原位、快速、非侵入式扫描，而不会影响光谱分辨率和高通量性能。扫描仪采集共同配准的 XRF/VNIR-SWIR 数据，从而使用户能够从可能的相关信息中获得最大利益：这两种技术可以在数据方面以最小的努力在同一分析点提供增强或补充信息处理，无需空间对齐。在目前的工作中，探讨了 IRIS 的定性和定量性能，同时介绍了对参考样本的实验室分析以及对真实案例研究的简要见解。