Micron ( IF 2.4 ) Pub Date : 2023-11-07 , DOI: 10.1016/j.micron.2023.103562 Misa Hayashida 1 , Jun Yamasaki 2 , Marek Malac 3
We investigated the effect of nanoparticle (NP) image broadening and its contrast change dependence on a support matrix thickness in a transmission electron microscope (TEM). We measured the effect of NP size and atomic number on its image broadening. Based on the experimental TEM images we generated tomograms of NPs on four types of support matrix. The measured shape aspect ratio of the NPs in such tomograms depends on the geometry of the support matrix. For example, the aspect ratio of 6 nm NP placed on a thin film with window-frame support is 1.14, while the aspect ratio of 6 nm NP on a rod-shaped support with 910 nm diameter is 1.67 in a tomogram.
中文翻译:
样品厚度影响 TEM 图像和电子断层扫描中的对比度和测量形状
我们在透射电子显微镜(TEM) 中研究了纳米粒子 (NP) 图像展宽的影响及其对比度变化对支撑基质厚度的依赖性。我们测量了纳米粒子尺寸和原子序数对其图像展宽的影响。基于实验 TEM 图像,我们在四种类型的支撑矩阵上生成了 NP 的断层图像。在此类断层图中测量的纳米粒子的形状纵横比取决于支撑矩阵的几何形状。例如,放置在具有窗框支撑的薄膜上的6 nm NP的纵横比为1.14,而在断层照片中,放置在直径910 nm的棒状支撑上的6 nm NP的纵横比为1.67。