The purpose of this Tutorial is to highlight the suitability of time-of-flight secondary ion mass spectrometry (ToF-SIMS) and OrbiTrap™ SIMS (Orbi-SIMS) in bone research by introducing fundamentals and best practices of bone analysis with these mass spectrometric imaging (MSI) techniques. The Tutorial includes sample preparation, determination of best-suited measurement settings, data acquisition, and data evaluation, as well as a brief overview of SIMS applications in bone research in the current literature. SIMS is a powerful analytical technique that allows simultaneous analysis and visualization of mineralized and nonmineralized bone tissue, bone marrow as well as implanted biomaterials, and interfaces between bone and implants. Compared to histological staining, which is the standard analytical procedure in bone research, SIMS provides chemical imaging of nonstained bone sections that offers insights beyond what is conventionally obtained. The Tutorial highlights the versatility of ToF- and Orbi-SIMS in addressing important questions in bone research. By illustrating the value of these MSI techniques, it demonstrates how they can contribute to advance progress in bone research.

中文翻译：

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用于骨骼研究的二次离子质谱。

本教程的目的是通过介绍使用这些质谱进行骨骼分析的基础知识和最佳实践，强调飞行时间二次离子质谱 (ToF-SIMS) 和 OrbiTrap™ SIMS (Orbi-SIMS) 在骨骼研究中的适用性成像（MSI）技术。本教程包括样品制备、确定最适合的测量设置、数据采集和数据评估，以及当前文献中 SIMS 在骨骼研究中应用的简要概述。SIMS 是一种强大的分析技术，可以同时分析和可视化矿化和非矿化骨组织、骨髓以及植入的生物材料以及骨和植入物之间的界面。与骨研究中的标准分析程序组织学染色相比，SIMS 可以对未染色的骨切片进行化学成像，从而提供超出传统方法的见解。本教程强调了 ToF- 和 Orbi-SIMS 在解决骨骼研究中的重要问题方面的多功能性。通过说明这些 MSI 技术的价值，展示了它们如何促进骨骼研究的进步。