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Surface saturation current densities of perovskite thin films from Suns-photoluminescence quantum yield measurements
Progress in Photovoltaics ( IF 6.7 ) Pub Date : 2024-01-15 , DOI: 10.1002/pip.3767
Robert Lee Chin 1 , Arman Mahboubi Soufiani 1 , Paul Fassl 2 , Jianghui Zheng 1, 3 , Eunyoung Choi 1 , Anita Ho‐Baillie 1, 3 , Ulrich W. Paetzold 2 , Thorsten Trupke 1 , Ziv Hameiri 1
Affiliation  

We present a simple yet powerful analysis of Suns-photoluminescence quantum yield measurements that can be used to determine the surface saturation current densities of thin film semiconductors. We apply the method to state-of-the-art polycrystalline perovskite thin films of varying absorber thickness. We show that the non-radiative bimolecular recombination in these samples originates from the surfaces. To the best of our knowledge, this is the first study to demonstrate and quantify non-linear (bimolecular) surface recombination in perovskite thin films.

中文翻译:

太阳光致发光量子产率测量的钙钛矿薄膜的表面饱和电流密度

我们对太阳光致发光量子产率测量进行了简单而强大的分析,可用于确定薄膜半导体的表面饱和电流密度。我们将该方法应用于不同吸收体厚度的最先进的多晶钙钛矿薄膜。我们证明这些样品中的非辐射双分子重组源自表面。据我们所知,这是第一项证明和量化钙钛矿薄膜中非线性(双分子)表面重组的研究。
更新日期:2024-01-15
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