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Depth-sectioning with environmental and atomic-resolution STEM
Microscopy ( IF 1.8 ) Pub Date : 2024-01-22 , DOI: 10.1093/jmicro/dfae005
Masaki Takeguchi 1 , Ayako Hashimoto 1 , Kazutaka Mitsuishi 1
Affiliation  

(Scanning) transmission electron microscopy (TEM) images of samples in gas and liquid media are acquired with an environmental cell (EC) via silicon nitride membranes. The ratio of sample signal against the background is a significant factor for resolution. Depth-sectioning Scanning TEM (STEM) is a promising technique that enhances the signal for a sample embedded in a matrix. It can increase the resolution to the atomic level, thereby enabling EC-STEM applications in important areas. This review introduces depth-sectioning STEM and its applications to high-resolution EC-STEM imaging of samples in gases and in liquids.

中文翻译:

使用环境和原子分辨率 STEM 进行深度切片

使用环境池 (EC) 通过氮化硅膜获取气体和液体介质中样品的(扫描)透射电子显微镜 (TEM) 图像。样本信号与背景的比率是分辨率的重要因素。深度切片扫描 TEM (STEM) 是一种很有前途的技术,可以增强嵌入基质中的样品的信号。它可以将分辨率提高到原子水平,从而使EC-STEM在重要领域的应用成为可能。本综述介绍了深度切片 STEM 及其在气体和液体样品高分辨率 EC-STEM 成像中的应用。
更新日期:2024-01-22
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