In future fusion reactors, W-Cu joining technology will be utilized to fabricate plasma facing components (PFCs). In this study, hydrogen isotope gas-driven permeation (GDP) and thermal desorption spectrometry (TDS) are performed for W-Cu, W and Cu samples to understand the impact of W-Cu joining on fuel transport. GDP results reveal that the diffusion activation energy of the W-Cu sample is 0.289 eV, significantly smaller than that of the reference sample. Compared with the reference sample, the deuterium (D) retention in the W-Cu sample is doubled. High resolution transmission electron microscope (HRTEM) images indicate the presence of a mixed region of about 20 nm at the W-Cu interface, with a dislocation density in this region of 7.38 × 10 m, three orders of magnitude higher than that in W and Cu. Simultaneously, energy dispersive spectrometer (EDS) data show that significant oxygen (O) impurities within the mixed region. Results from first principles simulations suggest that the presence of O at the interface can significantly alter the formation energy of H. The mixed layer not only serves as a diffusion barrier but also has the capacity to capture D. The presence of a high number of dislocations and O impurities in the mixed layer greatly impacts D transport in the W-Cu component.

中文翻译：

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W-Cu 接合对聚变反应堆面向等离子体组件中 D 输运行为的影响

在未来的聚变反应堆中，W-Cu连接技术将用于制造面向等离子体的组件（PFC）。在本研究中，对 W-Cu、W 和 Cu 样品进行氢同位素气体驱动渗透 (GDP) 和热解吸光谱 (TDS)，以了解 W-Cu 连接对燃料传输的影响。GDP结果表明W-Cu样品的扩散活化能为0.289 eV，明显小于参考样品。与参考样品相比，W-Cu 样品中的氘 (D) 保留量增加了一倍。高分辨率透射电子显微镜（HRTEM）图像显示，W-Cu界面处存在约20 nm的混合区域，该区域的位错密度为7.38×10 m，比W和Cu的位错密度高三个数量级。铜。同时，能量色散光谱仪 (EDS) 数据显示混合区域内存在大量氧 (O) 杂质。第一原理模拟的结果表明，界面处 O 的存在可以显着改变 H 的形成能。混合层不仅充当扩散势垒，而且具有捕获 D 的能力。大量位错的存在混合层中的O杂质极大地影响了W-Cu组分中的D传输。