Sample preparation, essential to any analysis, remains an under-documented step. Preparation methods for transmission electron microscopy (TEM) are complex and lead to artifacts that need to be identified to avoid wrong conclusions about the sample's microstructure. Ion milling techniques are increasingly becoming the reference techniques to prepare thin foils. The possibilities of different ion beam processes for milling samples will be shown and compared, using ceramic carbon/carbide fibers, a material applied in many industrial applications, as a test specimen. This overview of ion milling preparation techniques will enable us to identify the advantages, disadvantages and parameters in order to best prepare these thin samples. It will be carried out for the community, and will also highlight a new preparation method for ceramic fibers to minimize the artefacts inherent in these techniques.

中文翻译：

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透射电镜下离子铣削技术制备陶瓷纤维的对比研究

对于任何分析都至关重要的样品制备仍然是一个记录不足的步骤。透射电子显微镜 (TEM) 的制备方法很复杂，并且会产生伪影，需要对其进行识别，以避免对样品的微观结构得出错误的结论。离子铣削技术日益成为制备薄箔的参考技术。将使用陶瓷碳/碳化物纤维（一种应用于许多工业应用的材料）作为测试样本，展示和比较不同离子束工艺铣削样品的可能性。离子铣削制备技术的概述将使我们能够确定其优点、缺点和参数，以便最好地制备这些薄样品。它将针对社区进行，还将重点介绍一种新的陶瓷纤维制备方法，以最大限度地减少这些技术固有的人工制品。