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Simplification of selective imaging of dislocation loops: diffraction-selected on-zone STEM
Philosophical Magazine Letters ( IF 1.2 ) Pub Date : 2024-02-29 , DOI: 10.1080/09500839.2024.2321134
Masaya Kozuka 1 , Yuichi Miyahara 1 , Tomohiro Kobayashi 1
Affiliation  

Contrary to the conventional belief that, in transmission electron microscopy (TEM), selective and sharp imaging of dislocation loops can be realized only by accurate tilting of a specimen from the...

中文翻译:

位错环选择性成像的简化:衍射选择区上 STEM

与传统观念相反的是,在透射电子显微镜 (TEM) 中,只有通过精确倾斜样品才能实现位错环的选择性和清晰成像。
更新日期:2024-02-29
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