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Atomic force microscopy with qPlus sensors
MRS Bulletin ( IF 5 ) Pub Date : 2024-03-01 , DOI: 10.1557/s43577-023-00654-w
Franz J. Giessibl

Atomic force microscopy is one of the most important tools in nanoscience. It employs an atomic probe that can resolve surfaces with atomic and subatomic spatial resolution and manipulate atoms. The qPlus sensor is a quartz-based self-sensing cantilever with a high stiffness that, in contrast to Si cantilevers, allows to oscillate at atomic radius amplitudes in the proximity of reactive surfaces and thus provides a high spatial resolution. This article reports on the development of this sensor and discusses applications in materials research.

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中文翻译:

配备 qPlus 传感器的原子力显微镜

原子力显微镜是纳米科学中最重要的工具之一。它采用原子探针,可以以原子和亚原子空间分辨率解析表面并操纵原子。qPlus 传感器是一种基于石英的自感悬臂,具有高刚度,与硅悬臂不同,它允许在反应表面附近以原子半径振幅振荡,从而提供高空间分辨率。本文报道了该传感器的发展并讨论了在材料研究中的应用。

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更新日期:2024-03-02
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