Tungsten is one of the most promising materials for plasma facing components (PFCs), and -ray induced X-ray spectrometry (BIXS) is an important non-destructive method to obtain tritium depth profile and retention information for the development of PFCs, recovery of fuel and control of tritium safety in a fusion reactor. In this article, benchmark experiments to obtain tritium 3D profile in tungsten have been firstly performed using layer-by-layer chemical etching (LLCE) and imaging plate (IP) techniques. BIXS spectra have been detected at each layer. The average layer thickness of each erosion was controlled to be around 150 nm and 8 layers (the total thickness was 1.21 μm) were eroded, and the maximum uncertainty of tritium activity was 7.91 % in the LLCE experiments. Monte-Carlo simulations of BIXS spectra with Geant 4 code and four kinds of physical packages (Penelope, Livermore, EmStd. Opt1 and EmStd. Opt4) have been benchmarked against to the experimental results. Results show that all the four physical packages are not suitable to calculate the intensity of the BIXS spectra, and the current mode or cross sections should be improved to simulate the interaction between low electron/photon and tungsten accurately. However, the relative intensity of W-M peak and W-L can be simulated well using current physical packages such as EmStd. Opt4 and Livermore, which is a good indicator for tritium depth profile in tungsten.

中文翻译：

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通过检测 β 射线诱导 X 射线进行氚测量的钨中氚 3D 基准实验

钨是面向等离子体组件（PFC）最有前途的材料之一，γ射线诱导X射线光谱法（BIXS）是获取氚深度剖面和保留信息的重要非破坏性方法，用于PFC的开发、回收聚变反应堆中的燃料和氚安全控制。在本文中，首先使用逐层化学蚀刻 (LLCE) 和成像板 (IP) 技术进行了获得钨中氚 3D 轮廓的基准实验。每层都检测到了 BIXS 光谱。LLCE实验中，每次侵蚀平均层厚控制在150 nm左右，侵蚀8层（总厚度1.21 μm），氚活度最大不确定度为7.91%。使用 Geant 4 代码和四种物理包（Penelope、Livermore、EmStd. Opt1 和 EmStd. Opt4）对 BIXS 光谱进行蒙特卡罗模拟，并与实验结果进行了基准测试。结果表明，四种物理包都不适合计算BIXS光谱的强度，需要改进电流模式或截面以准确模拟低电子/光子与钨之间的相互作用。然而，使用当前的物理包（例如 EmStd）可以很好地模拟 WM 峰值和 WL 的相对强度。Opt4 和 Livermore，这是钨中氚深度剖面的良好指标。