Ferroelectric polymers, like poly(vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE)), find applications across various fields due to their unique mechanical and electrical properties. This study investigates the impact of thermal loading up to 90 °C on the ferroelectric characteristics of two distinct microstructures, spherulite-like and rice-like, formed during the thermal annealing after deposition of P(VDF-TrFE) thin films. Thermal cycles revealed a reduced ferroelectric activity in spherulite-like sample, in contrast to the ferroelectric stability observed in the rice-like counterparts. XRD analyses indicate that this behaviour is due to a crystalline phase stabilization of the γ-2b phase in the spherulite-like thin films. Furthermore, energy characteristics investigations highlighted a better performance of the pristine spherulite-like compared to the rice-like microstructure. All in all, despite these performance differences, our findings remark that careful considerations are needed in potential applications of P(VDF-TrFE) thin films where reliability and precision across a wide range of operating temperatures are required.

中文翻译：

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微观结构对 P(VDF-TrFE) 旋铸薄膜铁电性能热稳定性的影响

铁电聚合物，如聚偏二氟乙烯-三氟乙烯 (P(VDF-TrFE))，由于其独特的机械和电气性能而在各个领域得到广泛应用。本研究研究了高达 90 °C 的热负荷对 P(VDF-TrFE) 薄膜沉积后热退火过程中形成的两种不同微结构（球晶状和米状）铁电特性的影响。热循环表明，类球晶样品中的铁电活性降低，与类米样品中观察到的铁电稳定性形成鲜明对比。 XRD 分析表明，这种行为是由于球晶薄膜中 γ-2b 相的晶相稳定所致。此外，能量特性研究突显了原始球晶状微结构与米状微结构相比具有更好的性能。总而言之，尽管存在这些性能差异，但我们的研究结果表明，在 P(VDF-TrFE) 薄膜的潜在应用中需要仔细考虑，因为这些应用需要在广泛的工作温度范围内实现可靠性和精度。