X-ray-absorption fine-structure (XAFS) measurement by the fluorescence-yield (FY) method can be applied to samples of various shapes and concentrations. However, it is known that XAFS spectra obtained by the FY method do not precisely reflect the original X-ray absorption of the sample due to the self-absorption effect. We therefore propose a method for correcting the self-absorption by using FY XAFS spectra of original and diluted samples. The proposed self-absorption correction method can be applied to samples with unknown compositions. The effectiveness of the correction method was evaluated by applying it to the FY XAFS spectra of several iron oxides and their mixtures. As a result, the corrected FY XAFS of Fe K-edge spectra were almost identical to the XAFS spectra obtained by the transmission method. The suppressed EXAFS oscillations of the FY XAFS spectra were also recovered. These results validate the effectiveness of the proposed correction method. They also demonstrate that the corrected XANES spectra can be applicable to linear combination fitting analysis.

中文翻译：

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一种校正荧光 XAFS 光谱中显示的自吸收的方法

荧光产率（FY）法的X射线吸收精细结构（XAFS）测量可应用于各种形状和浓度的样品。然而，众所周知，由于自吸收效应，FY方法获得的XAFS光谱并不能准确反映样品原始的X射线吸收。因此，我们提出了一种使用原始样品和稀释样品的 FY XAFS 光谱来校正自吸收的方法。所提出的自吸收校正方法可应用于成分未知的样品。通过将其应用于几种铁氧化物及其混合物的 FY XAFS 光谱，评估了校正方法的有效性。结果，校正后的 Fe K 边 FY XAFS 光谱与透射法获得的 XAFS 光谱几乎相同。 FY XAFS 光谱的 EXAFS 振荡被抑制也被恢复。这些结果验证了所提出的校正方法的有效性。他们还证明，校正后的 XANES 光谱可适用于线性组合拟合分析。