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High Efficiency Ultra-Thin Normal-Incidence Ge-On-Si Photodetector Based on Optical Metasurface
Nano ( IF 1.2 ) Pub Date : 2024-02-20 , DOI: 10.1142/s1793292024500036
Chen zhang 1 , Weixi Lin 1 , Zhengtong Liu 1 , Lei Wang 1 , Fuyong Yue 1 , Zhenmin Chen 1 , Chunyang Ma 1 , Zhixue He 1
Affiliation  

The much thicker intrinsic absorption layer (IAL) in normal-incidence Ge-on-Si photodetectors (NIPD) usually causes a contradiction between responsivity and bandwidth. In response to this issue, here, we simulate the design of an NIPD with geranium (Ge) layers based on a “fishnet” metasurface, leading to a reduced device thickness as thin as 380nm. The optical simulation results show that the light field can be perfectly localized in the 210nm IAL, and the absorptivity is as high as 99.45% at 1550nm, which is even better than bulk materials. Moreover, the electrical simulation results suggest that the horizontal size of the photosensitive region can be reduced to 11.2 μm, while the responsivity of the photodetector is close to 1 A/W at −1V bias voltage, which is nearly 23 times that of a bulk device with the same thickness, and the 3dB bandwidth is up to 40GHz, which can be compared with waveguide photodetectors. Besides, this device also demonstrates a high signal-to-noise ratio with a low dark current of 28.68 nA, making it an excellent PD for opto-electrical communication.



中文翻译:

基于光学超表面的高效超薄正入射硅基锗光电探测器

正入射硅基硅光电探测器 (NIPD) 中较厚的本征吸收层 (IAL) 通常会导致响应度和带宽之间的矛盾。针对这个问题,我们在这里模拟了基于“鱼网”超表面的天竺葵(Ge)层NIPD的设计,从而使设备厚度减少至380纳米。光学模拟结果表明,光场可以完美定位在210°nm IAL,1550 时吸收率高达 99.45%nm,甚至比块体材料更好。此外,电学模拟结果表明,光敏区域的水平尺寸可以减小到11.2μm,而光电探测器的响应度在 -1 时接近 1 A/WV偏置电压,是同厚度体器件的近23倍,3dB带宽高达40GHz,可以与波导光电探测器进行比较。此外,该器件还具有高信噪比和 28.68 nA 的低暗电流,使其成为光电通信的优秀 PD。

更新日期:2024-02-20
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