Abstract

Sb_xSe_y thin-films were deposited by chemical-molecular beam deposition (CMBD) on soda-lime glass from antimony (Sb) and selenium (Se) precursors. Due to the separate control of Sb (between 980 and 1025°C) and Se (between 415 and 470°C) source temperature, thin films of antimony selenide with different component ratios carry out obtained. The investigation encompassed a comprehensive analysis of the elemental and phase composition, like the crystal structure, of Sb_xSe_y films. To achieve this, a combination of analytical techniques was employed, including energy-dispersive X-ray microanalysis, atomic force microscopy, Raman spectroscopy, X-ray diffraction, and scanning electron microscopy. The bandgap of the films was ascertained in the region 1.03–1.25 eV through the acquisition of absorption spectra using a spectrophotometer. This enabled the determination of the films’ optical properties and facilitated further analysis of their potential applications. The physical properties of Sb_xSe_y films with various ratio were researched.

中文翻译：

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在 400°C 基底温度下获得的 SbxSey 薄膜的结构和光学特性

摘要

通过化学分子束沉积 (CMBD) 在钠钙玻璃上以锑 (Sb) 和硒 (Se) 前体沉积_Sb x _Se y薄膜。由于分别控制Sb（980～1025℃）和Se（415～470℃）源温度，获得了不同组分比例的硒化锑薄膜。研究包括对 Sb _x Se _y薄膜的元素和相组成（如晶体结构）进行全面分析。为了实现这一目标，采用了多种分析技术的组合，包括能量色散 X 射线微量分析、原子力显微镜、拉曼光谱、X 射线衍射和扫描电子显微镜。通过使用分光光度计获取吸收光谱，确定薄膜的带隙在 1.03-1.25 eV 范围内。这使得能够确定薄膜的光学特性并促进对其潜在应用的进一步分析。研究了不同配比的Sb _x Se _y薄膜的物理性质。