The phosphate glasses with various EuO concentrations (0.1–3.0 w/w%) were synthesized and studied regarding the influence of europium dopant on the properties of irradiated phosphate glasses. During studies, samples were irradiated using two types of ionizing radiation sources (β and γ), with obtained doses up to 40 kGy. TL studies were investigated using various methods, such as TL response vs. radiation dose and the T-T method. To further investigate, if increasing the europium concentration affects the structure of electron traps, Computer Glow Curve Deconvolution studies linked with various heating rates methods were applied –increasing the concentration of dopant does not influence the number and energy of electron traps in irradiated samples. This fact was also supported by the results of the thermoluminescence spectrum – where no additional signals, besides wide signals from native glass were observed. OSL and IRSL studies were also conducted, for OSL we observed quenching of the signals, similar as in the TLD case. For IRSL studies all samples didn't display any signals. Finally, to understand if Eu also has a “protective” effect, decreasing the yield of generating F-centers during irradiation, UV-VIS spectroscopy was used. It was established that samples doped with europium oxide possess ca. 20% lower signals at F-center maximum (at 475 nm), the building-up maximum at 320 nm was observed, characteristic of the absorption band of Eu. All data indicate that europium in phosphate glass is taking the role of an efficient electron quencher. This quenching phenomenon occurs in three ways: first (direct) when the ion reduction process (Eu→Eu) competes with the formation of F-centers, and second (indirect) when during heating electrons coming from F-centers were quenched by near Eu ions. The third mechanism of quenching occurs through the electron's non-radiative transition induced by increased stress in the glass matrix caused by a large ionic radius of the dopant.

中文翻译：

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铕掺杂对磷酸盐玻璃影响的延伸研究

合成了不同EuO浓度（0.1–3.0 w/w%）的磷酸盐玻璃，并研究了铕掺杂剂对辐照磷酸盐玻璃性能的影响。在研究过程中，使用两种类型的电离辐射源（β 和 γ）照射样品，获得的剂量高达 40 kGy。使用各种方法对 TL 研究进行了研究，例如 TL 响应与辐射剂量和 TT 方法。为了进一步研究，增加铕浓度是否会影响电子陷阱的结构，应用了与各种加热速率方法相关的计算机辉光曲线解卷积研究——增加掺杂剂的浓度不会影响辐照样品中电子陷阱的数量和能量。热释光光谱的结果也支持了这一事实——除了来自天然玻璃的宽信号之外，没有观察到额外的信号。还进行了 OSL 和 IRSL 研究，对于 OSL，我们观察到信号的猝灭，与 TLD 情况类似。对于 IRSL 研究，所有样品均未显示任何信号。最后，为了了解Eu是否也具有“保护”作用，降低辐照过程中产生F中心的产量，使用了紫外可见光谱。已确定掺杂氧化铕的样品具有约。 F 中心最大值（475 nm）处的信号降低了 20%，观察到 320 nm 处的累积最大值，这是 Eu 吸收带的特征。所有数据表明，磷酸盐玻璃中的铕正在发挥有效的电子猝灭剂的作用。这种猝灭现象以三种方式发生：首先（直接）当离子还原过程（Eu→Eu）与F中心的形成竞争时，其次（间接）当加热过程中来自F中心的电子被近Eu猝灭时离子。第三种猝灭机制是通过电子的非辐射跃迁而发生的，该跃迁是由掺杂剂的大离子半径引起的玻璃基质中的应力增加引起的。