Micro‐x‐ray fluorescence (μ‐XRF) is a commonly used elemental analysis technique for glass physical evidence in forensic cases, which can detect major and trace elements in samples and potentially identify glass fragments according to the differences in elemental composition. However, when a sample is irradiated with polychromatic x‐rays, bremsstrahlung scattering from the source radiation provides noise in the fluorescence spectrum and affects the detection results. To improve the signal‐to‐noise ratio of the fluorescence spectrum, a Mμ‐XRF spectrometer constructed under the low‐power Mo target x‐ray tube condition was used to analyze ten kinds of common glass fragments. The application of laboratory Mμ‐XRF analysis in single‐point detection of tiny glass materials was studied. Experimental results show that the detection limit of Sr element was 51 μg/L, and the spectrometer can distinguish different types of small glass fragments according to the fluorescence spectrum information.

中文翻译：

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单色微X射线荧光在玻璃物证溯源中的应用研究

微X射线荧光（μ-XRF）是法医案件中常用的玻璃物证元素分析技术，可以检测样品中的主量元素和微量元素，并根据元素成分的差异来识别玻璃碎片。然而，当样品受到多色 X 射线照射时，来自源辐射的轫致辐射会在荧光光谱中产生噪声并影响检测结果。为了提高荧光光谱的信噪比，采用低功率Mo靶X射线管条件下构建的Mμ-XRF光谱仪对10种常见玻璃碎片进行了分析。研究了实验室Mμ-XRF分析在微小玻璃材料单点检测中的应用。实验结果表明，Sr元素的检出限为51 μg/L，光谱仪可以根据荧光光谱信息区分不同类型的小玻璃碎片。