The theoretical background to the formation of interference fringes in a triple Laue X-ray interferometer by a specimen having plano-concave form is presented. The interference fringes in the general case have an elliptical form. The relation between the radius of the specimen, the refractive index and the radii of the interference fringes is established. For two epoxy lenses having different radii, the interference fringes are registered. The refractive index and the radii are determined by measuring the radii of the obtained interference fringes.

中文翻译：

---

使用 X 射线干涉仪测量样品的几何特性和折射率

提出了平凹样品在三重劳厄 X 射线干涉仪中形成干涉条纹的理论背景。一般情况下的干涉条纹具有椭圆形形状。建立了样品半径、折射率和干涉条纹半径之间的关系。对于具有不同半径的两个环氧树脂透镜，记录干涉条纹。通过测量所获得的干涉条纹的半径来确定折射率和半径。