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The impact of copper and silver as interlayers of zinc telluride films on the physical properties and antifungal efficacy of zinc telluride films
Materials Chemistry and Physics ( IF 4.6 ) Pub Date : 2024-03-28 , DOI: 10.1016/j.matchemphys.2024.129262
M.F. Hasaneen , Shaima M.N. Moustafa

The study aimed to investigate the structure, physical properties, and antifungal activity of ZnTe single-layer, ZnTe/Cu/ZnTe (ZCZ), and ZnTe/Ag/ZnTe (ZAZ) multilayer films. The ZAZ multilayer had the greatest antifungal efficacy, with ZCZ and ZnTe following in descending order of effectiveness. We observed that ZCZ had a MIC of 0.30 mol/ML and that ZAZ had a MIC of 20 mol/L. An X-ray diffraction (XRD) test confirmed a cubic crystal structure for all films, indicating that the crystals were mainly arranged along the (111) plane. For ZnTe films, the average size of crystallites was estimated to be roughly 15 nm, while for ZAZ and ZCZ films, it remained relatively constant at around 14.2 nm and 14.1 nm, respectively. We determined the particle size of ZnTe, ZCZ, and ZAZ using a scanning electron microscope (SEM) and ImageJ analysis. The obtained sizes were 98 nm, 200 nm, and 81 nm for ZnTe, ZCZ, and ZAZ, respectively. We used Swanepoel method and the Cauchy equation to determine the refractive index (n), film thickness (d), and refractive index as a function of wavelength. We used the Tauc equation to find that the optical band gaps (E) of the films were 1.67 eV for ZnTe, 1.5 eV for ZCZ, and 1.55 eV for ZAZ. We analyzed six new frequency bands found through FTIR analysis. These bands showed important information about the chemical structure of the films.

中文翻译:

铜、银作为碲化锌薄膜中间层对碲化锌薄膜物理性能及抗真菌功效的影响

该研究旨在研究 ZnTe 单层、ZnTe/Cu/ZnTe (ZCZ) 和 ZnTe/Ag/ZnTe (ZAZ) 多层薄膜的结构、物理性质和抗真菌活性。 ZAZ 多层膜具有最大的抗真菌功效,ZCZ 和 ZnTe 的功效按降序排列。我们观察到 ZCZ 的 MIC 为 0.30 mol/L,ZAZ 的 MIC 为 20 mol/L。 X射线衍射(XRD)测试证实所有薄膜均具有立方晶体结构,表明晶体主要沿(111)面排列。对于 ZnTe 薄膜,微晶的平均尺寸估计约为 15 nm,而对于 ZAZ 和 ZCZ 薄膜,微晶的平均尺寸分​​别保持在 14.2 nm 和 14.1 nm 左右。我们使用扫描电子显微镜 (SEM) 和 ImageJ 分析确定了 ZnTe、ZCZ 和 ZAZ 的粒径。 ZnTe、ZCZ 和 ZAZ 的尺寸分别为 98 nm、200 nm 和 81 nm。我们使用 Swanepoel 方法和柯西方程来确定折射率 (n)、薄膜厚度 (d) 以及作为波长函数的折射率。我们使用 Tauc 方程发现薄膜的光学带隙 (E) 对于 ZnTe 为 1.67 eV,对于 ZCZ 为 1.5 eV,对于 ZAZ 为 1.55 eV。我们分析了通过 FTIR 分析发现的六个新频段。这些谱带显示了有关薄膜化学结构的重要信息。
更新日期:2024-03-28
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