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Possibilities of various arrangements of X-ray fluorescence analysis in the study of paintings
Radiation Physics and Chemistry ( IF 2.9 ) Pub Date : 2024-03-29 , DOI: 10.1016/j.radphyschem.2024.111731
Ladislav Musílek , Pavel Novotný , Tomáš Trojek

Energy dispersive X-ray fluorescence analysis (EDXRF) is a very useful method of elemental analysis in the study of works of art and archaeological finds, allowing the simultaneous non-destructive identification of a number of elements. A certain problem, if samples are not to be extracted from the investigated artifact, is its small depth range. However, this is not a serious drawback when it comes to the analysis of thin layers, such as plating or painting.

中文翻译:

X射线荧光分析在绘画研究中的各种安排的可能性

能量色散 X 射线荧光分析 (EDXRF) 是艺术作品和考古发现研究中非常有用的元素分析方法,可以同时无损地识别多种元素。如果不从所研究的工件中提取样本,则存在一个特定问题:其深度范围较小。然而,当分析薄层(例如电镀或喷漆)时,这并不是一个严重的缺点。
更新日期:2024-03-29
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