High resolution synchrotron powder X-ray diffraction analysis of Cr-doped UO samples with additions of CrO as 0, 500, 1000, 1500, 2500 to 3500 ppm prepared under sintering conditions of -420 kJ/mol and 1700 °C is reported. The lattice dependence from Cr doping is established through the Rietveld refinement method where the rate of linear lattice parameter contraction from Cr doping, , was found to be considerably smaller and more subtle than previously described. This investigation highlights the need for high resolution and precise specimen preparation when measuring and interpreting subtle changes to nuclear material crystal structures due to trace doping.

中文翻译：

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通过高分辨率同步加速器 X 射线粉末衍射测定 Cr 掺杂引起的 UO2 晶格收缩

报告了在 -420 kJ/mol 和 1700 °C 的烧结条件下制备的 Cr 掺杂 UO 样品的高分辨率同步加速器粉末 X 射线衍射分析，其中 CrO 添加量为 0、500、1000、1500、2500 至 3500 ppm。 Cr 掺杂的晶格依赖性是通过 Rietveld 精修方法建立的，其中 Cr 掺杂的线性晶格参数收缩率 被发现比之前描述的要小得多且更微妙。这项研究强调了在测量和解释微量掺杂导致的核材料晶体结构的细微变化时需要高分辨率和精确的样品制备。