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The Surge Current Failure and Thermal Analysis of 4H-SiC Schottky Barrier Diode
IEEE Transactions on Electron Devices ( IF 3.1 ) Pub Date : 2024-04-09 , DOI: 10.1109/ted.2024.3385389 Bin Zhang 1 , Yu Zhong 2 , Peng Cui 1 , Yingxin Cui 1 , Mingsheng Xu 1 , Handoko Linewih 1 , Jisheng Han 1
中文翻译：
4H-SiC肖特基势垒二极管的浪涌电流失效及热分析
更新日期：2024-04-09
IEEE Transactions on Electron Devices ( IF 3.1 ) Pub Date : 2024-04-09 , DOI: 10.1109/ted.2024.3385389 Bin Zhang 1 , Yu Zhong 2 , Peng Cui 1 , Yingxin Cui 1 , Mingsheng Xu 1 , Handoko Linewih 1 , Jisheng Han 1
Affiliation
中文翻译：
4H-SiC肖特基势垒二极管的浪涌电流失效及热分析
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