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Reliability Evaluation of Isolated LDMOS Devices and Condition Monitoring Solution
IEEE Transactions on Components, Packaging and Manufacturing Technology ( IF 2.2 ) Pub Date : 2024-04-10 , DOI: 10.1109/tcpmt.2024.3385310 Rahman Sajadi , Chi Xu , Bhanu Teja Vankayalapati , Masoud Farhadi , Bilal Akin
中文翻译:
隔离 LDMOS 器件的可靠性评估和状态监测解决方案
更新日期:2024-04-10
IEEE Transactions on Components, Packaging and Manufacturing Technology ( IF 2.2 ) Pub Date : 2024-04-10 , DOI: 10.1109/tcpmt.2024.3385310 Rahman Sajadi , Chi Xu , Bhanu Teja Vankayalapati , Masoud Farhadi , Bilal Akin
中文翻译:
隔离 LDMOS 器件的可靠性评估和状态监测解决方案