当前位置：
X-MOL 学术
›
IEEE Trans. Device Mat Reliab.
›
论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
A Low Area-Overhead and Low Delay Triple-Node-Upset Self-Recoverable Design Based On Stacked Transistors
IEEE Transactions on Device and Materials Reliability ( IF 2 ) Pub Date : 2024-04-10 , DOI: 10.1109/tdmr.2024.3386954 Hui Xu 1 , Jiuqi Li 1 , Ruijun Ma 1 , Huaguo Liang 2 , Chaoming Liu 1 , Senling Wang 3 , Xiaoqing Wen 4
中文翻译：
基于堆叠晶体管的低面积开销和低延迟三节点翻转自恢复设计
更新日期：2024-04-10
IEEE Transactions on Device and Materials Reliability ( IF 2 ) Pub Date : 2024-04-10 , DOI: 10.1109/tdmr.2024.3386954 Hui Xu 1 , Jiuqi Li 1 , Ruijun Ma 1 , Huaguo Liang 2 , Chaoming Liu 1 , Senling Wang 3 , Xiaoqing Wen 4
Affiliation
中文翻译：
基于堆叠晶体管的低面积开销和低延迟三节点翻转自恢复设计
京公网安备 11010802027423号