This paper introduces spectral incoherent diffractive imaging (SIDI) as a novel method for achieving dark-field imaging of nanostructures with heterogeneous oxidation states. With SIDI, shifts in photoemission profiles can be spatially resolved, enabling the independent imaging of the underlying emitter distributions contributing to each spectral line. In the x-ray domain, this approach offers unique insights beyond the conventional combination of diffraction and x-ray emission spectroscopy. When applied at x-ray free-electron lasers, SIDI promises to be a versatile tool for investigating a broad range of systems, offering unprecedented opportunities for detailed characterization of heterogeneous nanostructures for catalysis and energy storage, including of their ultrafast dynamics.

中文翻译：

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利用荧光强度相关性进行具有高光谱灵敏度的纳米级 X 射线成像

本文介绍了光谱非相干衍射成像（SIDI）作为一种实现异质氧化态纳米结构暗场成像的新方法。通过 SIDI，可以在空间上解析光电发射分布的变化，从而能够对每条谱线贡献的底层发射器分布进行独立成像。在 X 射线领域，这种方法提供了超越衍射和 X 射线发射光谱的传统组合的独特见解。当应用于 X 射线自由电子激光器时，SIDI 有望成为研究各种系统的多功能工具，为催化和能量存储的异质纳米结构（包括其超快动力学）的详细表征提供前所未有的机会。