In recent years, SRAM-based Field-Programmable Gate Arrays (FPGAs) have seen a surge in deployment within aerospace applications. Despite their widespread use, these FPGAs, particularly their embedded Static Random Access Memory (SRAM) and user logic, exhibit a notable susceptibility to Single Event Upsets (SEU), a phenomenon leading to erroneous connections or routing discrepancies. This paper presents an exhaustive survey of fault-tolerance methodologies pertinent to SRAM-based FPGAs operating in radiation-intensive environments. Initially, we delineate the architecture of the SRAM-based FPGAs, elucidating the mechanisms underlying SEU occurrences and their subsequent malfunctions. This is followed by a detailed exploration of various strategies employed to assess the resilience of SRAM-based FPGAs against SEU-related disruptions, mainly including the Triple Module Redundancy (TMR) and the configuration scrubbing technology. Collectively, this survey aspires to function as an instructive compendium for engineers and researchers specializing in the development of fault-tolerance mechanisms for SRAM-based FPGAs, particularly in the context of aerospace applications.

中文翻译：

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辐射环境下 FPGA 可靠性的最新进展

近年来，基于 SRAM 的现场可编程门阵列 (FPGA) 在航空航天应用中的部署激增。尽管用途广泛，但这些 FPGA，特别是其嵌入式静态随机存取存储器 (SRAM) 和用户逻辑，对单事件翻转 (SEU) 表现出明显的敏感性，这种现象会导致错误连接或路由差异。本文对与在辐射密集环境中运行的基于 SRAM 的 FPGA 相关的容错方法进行了详尽的调查。首先，我们描述了基于 SRAM 的 FPGA 的架构，阐明了 SEU 发生及其后续故障的潜在机制。接下来详细探讨了用于评估基于 SRAM 的 FPGA 针对 SEU 相关中断的恢复能力的各种策略，主要包括三模块冗余 (TMR) 和配置清理技术。总的来说，这项调查旨在为专门从事基于 SRAM 的 FPGA 容错机制开发的工程师和研究人员提供指导性纲要，特别是在航空航天应用领域。