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Modified Mask R-CNN with KNN Algorithm Based Segmentation and Classification for Prediction of Brain Tumor Types Optoelectron. Instrument. Proc. Pub Date : 2024-03-31 Anjali Hemant Tiple, A. B. Kakade
Abstract Separation of diseased brain tissues from normal brain tissues is one of the most important tasks in any system for detecting brain tumors. It is important to note that the field of brain tumor analysis has effectively applied medical image processing techniques, particularly on MR images, to automate crucial procedures including extraction, segmentation, and classification for tumor detection
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Unusual Properties of Raman Spectra of Carbon Graphite from Seregen Deposit (Taimyr). A New Allotropic Form of Carbon? Optoelectron. Instrument. Proc. Pub Date : 2024-03-26 N. N. Mel’nik, S. K. Simakov, D. S. Kostsov
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Raman Scattering Spectroscopy and Photoluminescence of GaAs Nanowires Optoelectron. Instrument. Proc. Pub Date : 2024-03-26 I. V. Kalachev, I. A. Milekhin, E. A. Emel’yanov, V. V. Preobrazhenskii, V. S. Tumashev, A. G. Milekhin, A. V. Latyshev
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Small-Sized Hyperspectrometers with On-Line Image Recording Optoelectron. Instrument. Proc. Pub Date : 2024-03-26 S. M. Borzov, P. E. Kotlyar, O. I. Potaturkin
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Determination of the Pore Direction in a Crystalline Metal-Organic Framework by Raman Spectroscopy and Periodic Calculations Based on the Electron Density Functional Theory Optoelectron. Instrument. Proc. Pub Date : 2024-03-26 N. V. Slyusarenko, I. D. Yushina, E. A. Slyusareva, E. V. Golovkina, S. N. Krylova, A. N. Vtyurin, A. S. Krylov
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Raman and ODMR Spectroscopy of NV Centers in Nanolayers and Nanopillars of $$\mathbf{{\langle 111\rangle}}$$ Diamond after Etching with a Focused Beam of Ga Ions Optoelectron. Instrument. Proc. Pub Date : 2024-03-26 I. A. Kartashov, S. N. Podlesnyi, V. A. Antonov, V. P. Popov, Yu. N. Pal’yanov
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Masked Faces Recognition Using Deep Learning Models and the Structural Similarity Measure Optoelectron. Instrument. Proc. Pub Date : 2024-03-26 Ouahab Abdelwhab
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Millifluidic Cuvette for Measuring Raman Scattering from Single Oocytes Manufactured by Photopolymer Stereolithography Optoelectron. Instrument. Proc. Pub Date : 2024-03-26 K. A. Okotrub, Yu. V. Zaitseva, S. V. Adishchev, T. A. Rakhmanova, S. Ya. Amstislavskii
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Methods of Measuring the Narrow-Band Generation Dynamics near the Generation Threshold of a Raman Fiber Laser with a Random Feedback Optoelectron. Instrument. Proc. Pub Date : 2024-03-26 A. E. Kirik, I. D. Vatnik, O. A. Gorbunov, D. V. Churkin
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Laser Generation without Population Inversion in the Red Wing of the $${D}_{1}$$ -Line of Alkali Metal Atoms under Resonant Diode Pumping Optoelectron. Instrument. Proc. Pub Date : 2024-03-26 A. I. Parkhomenko, A. M. Shalagin
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Separation of Spectral Lines from a Broadband Background and Noise Filtering by Modified Tikhonov Regularization Optoelectron. Instrument. Proc. Pub Date : 2024-03-26 I. A. Larkin, A. V. Vagov, V. I. Korepanov
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Structure and Thermal Conductivity of Thin Films of the Si $${}_{{1-x}}$$ Ge $${}_{{x}}$$ Alloy Formed by Electrochemical Deposition of Germanium into Porous Silicon Optoelectron. Instrument. Proc. Pub Date : 2024-03-26 D. L. Goroshko, I. M. Gavrilin, A. A. Dronov, O. A. Goroshko, L. S. Volkova
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Experimental Characteristics of an Atmospheric Fiber Laser System for Detecting Acoustic Infrasonic Oscillations forGeoecological Monitoring Optoelectron. Instrument. Proc. Pub Date : 2024-03-26 A. V. Britvin, S. I. Konyaev, B. V. Poller, A. B. Poller, M. S. Khairetdinov
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Testing of Long-Term Stability of Metrological Characteristics of the CLWS-300 Laser Image Generator Optoelectron. Instrument. Proc. Pub Date : 2024-03-08 V. P. Kiryanov, A. G. Karakotskii, A. V. Kiryanov
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Stochastic Estimation of Angular Orientation Parameters of a Moving Object by Inertial-Satellite Measurements Optoelectron. Instrument. Proc. Pub Date : 2024-03-08 S. V. Sokolov, V. A. Pogorelov, A. L. Okhotnikov
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Reconstruction of 3D Objects Based on Data from a Single View Optoelectron. Instrument. Proc. Pub Date : 2024-03-08 S. I. Vyatkin, B. S. Dolgovesov
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Optimization of The Thickness of Single-Layer Antireflection SiO $${}_{\mathbf{2}}$$ Coating on a Silicon Photodiode Depending of the Characteristics of Incident Light Optoelectron. Instrument. Proc. Pub Date : 2024-03-08 A. V. Timofeev, A. I. Mil’shtein, D. N. Grigor’ev
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Algorithm for Searching for Optimal Values of Parameters of Singular Point Detectors Based on Local Image Characteristics Optoelectron. Instrument. Proc. Pub Date : 2024-03-08 A. V. Likhachev
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Total Energy Control of Aircraft Longitudinal Motion Optoelectron. Instrument. Proc. Pub Date : 2024-03-08 S. A. Belokon, Yu. N. Zolotukhin, K. Yu. Kotov, A. S. Maltsev, A. P. Yan
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Construction of Texture Feature Profiles Using Whole Core Images Optoelectron. Instrument. Proc. Pub Date : 2024-03-08 D. O. Makienko
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Optimization of Local Heat Transfer in Impact Jet Using Active Flow Control and Feedback Optoelectron. Instrument. Proc. Pub Date : 2024-03-08 M. P. Tokarev, M. Yu. Nichik, O. A. Gobyzov, I. A. Fedotov, V. M. Dulin
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The Influence of Nonlinear Phase Noise on Amplitude-Phase Channel OFDM Signals in Coherent Fiber-Optic Transmission Systems Optoelectron. Instrument. Proc. Pub Date : 2024-03-08 V. A. Vardanyan
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Implementation of Distributed Simulation Modeling in MTSS System Optoelectron. Instrument. Proc. Pub Date : 2024-01-12 S. V. Rudometov, V. V. Okolnishnikov, S. S. Zhuravlev
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Simulation of Optimal Design of a Cooled Diaphragm of a Thermal Imaging Camera Optoelectron. Instrument. Proc. Pub Date : 2024-01-12 A. R. Novoselov, S. V. Khryashchev, P. A. Aldokhin, P. P. Dobrovol’skii, K. P. Shatunov
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Software Module of Hashing User Biometric Data Optoelectron. Instrument. Proc. Pub Date : 2024-01-12 A. S. Ismagilova, N. D. Lushnikov
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Study of the Efficiency of Different Architectures of Recurrent Neural Networks for Sentiment Analysis of Russian-Language Comments of Social Network Users Optoelectron. Instrument. Proc. Pub Date : 2024-01-12 A. N. Zhdanova, A. V. Kupriyanov, A. A. Golova, A. S. Bulgakov, D. S. Bakanov
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Energy-Saving Control in Distributed Parameter Systems with Uniform Estimates of Target Sets Optoelectron. Instrument. Proc. Pub Date : 2024-01-12 E. Ya. Rapoport, Yu. E. Pleshivtseva, I. S. Levin
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Infrared and Terahertz Radiation Detectors Based on Opto-Acoustic Converters (a Review) Optoelectron. Instrument. Proc. Pub Date : 2024-01-12 P. E. Kotlyar
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Schemes of Combining Discriminant Functions to Improve the Classification Accuracy for Ensemble of Data Sources Optoelectron. Instrument. Proc. Pub Date : 2024-01-12 M. M. Lange, S. V. Paramonov
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Acquisition and Control System for Flowing Liquid Laser Optoelectron. Instrument. Proc. Pub Date : 2024-01-12 Rajeev Kumar Dohare, Mainuddin, Gaurav Singhal
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Accounting for the Influence of the Corrector Hysteresis on the Dynamic Characteristics of Adaptive Optics Systems Optoelectron. Instrument. Proc. Pub Date : 2024-01-12 V. P. Lukin
Abstract This paper continues the analysis of the dynamic characteristics of adaptive optics systems operating in a turbulent atmosphere, in particular, the influence of such an important factor of an active corrector mirror as its hysteresis. The requirements for the dynamic parameters of the feedback loop of the adaptive system for laser radiation focusing through a turbulent atmosphere are calculated
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Search for the Optimal Initial Concentrations of Catalytic Reaction Compounds on the Basis of a Kinetic Model Optoelectron. Instrument. Proc. Pub Date : 2024-01-12 E. V. Antipina, S. A. Mustafina, A. F. Antipin
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Non-Asymptotic Confidence Estimation of the Autoregressive Process Paremeters in the Case of an Unknown Noise Variance Optoelectron. Instrument. Proc. Pub Date : 2024-01-12 S. E. Vorobeychikov, A. V. Pupkov
Abstract A non-asymptotic procedure of constructing the confidence region of the parameter of the \(p\)-th order Gaussian autoregressive process AR(p) in the case of an unknown process noise variance is considered. The confidence estimation procedure is based on the martingale property of the numerator of estimate deviation of the least square technique (LST). The results of numerical modeling are
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Methods of Constructing Functional Observers for Nonlinear Dynamic Systems Optoelectron. Instrument. Proc. Pub Date : 2024-01-12 A. N. Zhirabok, A. V. Zuev, A. E. Shumskii
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Real-Time Spline Adaptive Filter: Design and Efficiency Analysis Optoelectron. Instrument. Proc. Pub Date : 2023-12-10 E. A. Kochegurova, Yu. A. Martynova
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Degradation of the Properties of SOS Ferroelectric Pseudo-MOS Transistors after Irradiation with Fast Heavy Xe and Bi Ions Optoelectron. Instrument. Proc. Pub Date : 2023-12-01
Abstract The results are presented on changes in the parameters of pseudo-MOS transistors based on silicon-on-sapphire (SOS) mesastructures upon irradiation with swift heavy ions (SHIs) of Xe \({}^{+26}\) (150 MeV) and Bi \({}^{+51}\) (670 MeV) to a fluence of \(2\,\times\,10^{11}\) cm \({}^{-2}\) , indicating the accumulation of mechanical stresses and charges in the intermediate ferroelectric (Fe)
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Raman Scattering of Light in Thin Films of Fe, Cr, and Ca Silicides on Silicon and Sapphire Optoelectron. Instrument. Proc. Pub Date : 2023-12-01
Abstract Epitaxial and polycrystalline films of iron (Fe), chromium (Cr), and calcium (Ca) silicides of various thicknesses (from 3.2 to 380 nm) were grown on silicon and sapphire substrates in ultrahigh vacuum by three methods (solid-phase epitaxy, reactive epitaxy and molecular beam epitaxy). The crystal structure and matching with the silicon lattice were determined for them using the X-ray diffraction
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Optical Tensometry in the Wheel–Rail Interaction Problem Optoelectron. Instrument. Proc. Pub Date : 2023-10-30 V. N. Fedorinin, S. A. Bekher, V. S. Vyplaven, V. I. Sidorov, A. N. Baibakov, S. V. Plotnikov
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Spatiospectral Description of Current Dipole as a Source of the Magnetic Field of the Heart Optoelectron. Instrument. Proc. Pub Date : 2023-10-30 N. V. Golyshev, S. V. Motorin, D. N. Golyshev
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Neural Network Technologies for Detection and Classification of Objects Optoelectron. Instrument. Proc. Pub Date : 2023-10-30 S. M. Borzov, E. S. Nezhevenko
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Model and Implementation of a Open-Code Staff Appraisal System for Small and Medium Enterprises Optoelectron. Instrument. Proc. Pub Date : 2023-10-30 K. I. Budnikov, D. A. Safenreiter
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Neural Network Detection of Microparticles on Reconstructed Holographic Images of Volumetric Medium Optoelectron. Instrument. Proc. Pub Date : 2023-10-30 N. A. Kuzmin, Yu. D. Arapov
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On Possibility of Complete Suppression of the Instrumental Error Component from Inaccuracy of a Diffraction Grating Optoelectron. Instrument. Proc. Pub Date : 2023-10-30 V. P. Kir’yanov, A. V. Kir’yanov
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Experimental Validation of the Theoretical Provision of Circular Aperture Synthesis Optoelectron. Instrument. Proc. Pub Date : 2023-10-30 V. P. Yushchenko, S. A. Litvinenko, O. V. Gofman, T. V. Duluba
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Two-Dimensional Electromechanical Waves in Microelectromechanical Structures (MEMS) with a Nanoscale Gap Optoelectron. Instrument. Proc. Pub Date : 2023-10-30 A. A. Sokolov, S. D. Ivanov
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Determining the Root-Mean-Square Amplitude of the Shear Modulus in Salol by the Inelastic Light Scattering Method Optoelectron. Instrument. Proc. Pub Date : 2023-10-30 S. V. Adishchev, I. V. Zaitseva, V. A. Zykova, V. K. Malinovskii, V. N. Novikov
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Comparison of Methods for Testing the Hypothesis of Independence of Random Variables Based on a Nonparametric Classifier and Pearson’s Chi-Squared Test Optoelectron. Instrument. Proc. Pub Date : 2023-10-01
Abstract A technique for testing the hypothesis about the independence of random variables, based on a nonparametric pattern recognition algorithm, is used in the analysis of ambiguous dependencies. The pattern recognition algorithm meets the maximum likelihood criterion. The assessment of distribution laws in classes is carried out using initial statistical data under the assumption of independence
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Principal Components Analysis for Processing Multiparameter Acoustic Signals of the Mirror-Shadow Technique for Bar Stock Control Optoelectron. Instrument. Proc. Pub Date : 2023-10-01
Abstract The paper provides reasoning for using principal component analysis to assess the generalized characteristics of defects in processing of multiparameter acoustic signals of the multiple mirror-shadow technique for bar stock control. This technique made it possible to reduce the number of signal parameters when forming rejection criteria, develop a methodology for assessing the generalized
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Fast Selection of Bandwidths for Nonparametric Estimation of the Probability Density of a Two-Dimensional Random Variable with Dependent Components Optoelectron. Instrument. Proc. Pub Date : 2023-08-24 A. V. Lapko, V. A. Lapko
Abstract A method for fast selection of bandwidths of kernel functions in the nonparametric estimation of a two-dimensional random variable with dependent components is proposed. The method is based on results of the analysis of asymptotic properties of the Rosenblatt–Parzen kernel probability density estimate. The properties of a fast algorithm for bandwidth selection in the considered nonparametric
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Comparative Analysis of Algorithms for Detecting Reference Object in an Image Optoelectron. Instrument. Proc. Pub Date : 2023-08-24 D. A. Mikhailenko
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Comparison of Neural Network Methods for Data Preprocessing in Solving Problems of Analysis, Diagnosis, and Classification of Defects of Radio-Electronic Equipment Optoelectron. Instrument. Proc. Pub Date : 2023-08-24 B. P. Ivanenko, S. A. Klestov, V. I. Syryamkin
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A Method of Adaptive Quantization for the Coefficients of a Discrete Wavelet Transformation Optoelectron. Instrument. Proc. Pub Date : 2023-08-24 S. V. Sai
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Robust Positioning of Moving Objects on Analytical Trajectories Using Satellite Navigation Measurements Optoelectron. Instrument. Proc. Pub Date : 2023-08-24 S. V. Sokolov, V. A. Pogorelov, M. V. Polyakova, K. T. Lomtatidze
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On Stabilization of Optical Radiation in Turbulent Atmosphere Optoelectron. Instrument. Proc. Pub Date : 2023-08-24 V. V. Lavrinov, L. V. Antoshkin, L. N. Lavrinova, A. A. Selin
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Single-Position Passive Location of a Moving Target with Consideration of the Evolutionof the Period and Level of the Pulsed Radio Signal Optoelectron. Instrument. Proc. Pub Date : 2023-08-24 Yu. G. Bulychev
Abstract The single-position hybrid method for bearing-free passive location of a moving source of pulsed periodic radio signal emission with consideration of temporal and energy measurements of a stationary observer is proposed. The method is applicable for any directions of target motions for both straight and curved trajectories; no current estimation of the Doppler frequency is required; the measured
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MTF-Based Approach to Determining the Bulk Diffusion Length of Photogenerated Charge Carriers in the Absorber Material of MCT-Based Infrared Focal Plane Arrays Optoelectron. Instrument. Proc. Pub Date : 2023-08-24 V. V. Vasil’ev, A. V. Vishnyakov, G. Yu. Sidorov, V. A. Stuchinsky
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Symmetry between Some Methods of Autonomous Spacecraft Navigation and Methods of Determining Their Position from Earth Optoelectron. Instrument. Proc. Pub Date : 2023-08-24 M. E. Prokhorov, A. I. Zakharov, I. V. Kuznetsova