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Correction Qual. Eng. (IF 2.0) Pub Date : 2024-04-05
Published in Quality Engineering (Ahead of Print, 2024)
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Variation analysis for custom manufacturing processes Qual. Eng. (IF 2.0) Pub Date : 2024-04-04 Linxi Li, Anh Tuan Bui
Discovering and addressing unknown, including unanticipated, part-to-part variation sources is an important, yet challenging problem in manufacturing variation reduction. The state-of-art methods f...
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Estimation of the lot fraction defective in a finite lot of products with auxiliary quality characteristics Qual. Eng. (IF 2.0) Pub Date : 2024-03-28 Juan Francisco Muñoz-Rosas, Francisco Javier Blanco-Encomienda, Encarnación Álvarez-Verdejo, Ferran Vendrell-Herrero
Many companies use sampling plans for the acceptance or rejection of lots of products. The final outcome of this decision-making process is based on the inspection of a sample of products selected ...
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A primer on predictive maintenance: Potential benefits and practical challenges Qual. Eng. (IF 2.0) Pub Date : 2024-03-25 Henrik Hviid Hansen, Murat Kulahci, Bo Friis Nielsen
We present an overview of predictive maintenance (PdM) in industrial operations, highlighting its evolution, benefits, challenges, and potential economic impact. It is assessed that there are consi...
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Cumulative entropy of progressively type-II censored order statistics and associated optimal life testing-plans Qual. Eng. (IF 2.0) Pub Date : 2024-03-14 Siddhartha Chakraborty, Ritwik Bhattacharya, Biswabrata Pradhan
Progressive censoring schemes allow removal of censoring units at the time of each failure. This flexibility of removing items during the experiment makes progressive censoring very effective but i...
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A model for failure-time data with two dependent failure modes and prediction of future failures Qual. Eng. (IF 2.0) Pub Date : 2024-03-05 Aakash Agrawal, Debanjan Mitra, Ayon Ganguly
Often in reliability studies we observe failure-time data with two dependent failure modes. In this article, by using a bivariate Weibull model with distinct shape parameters, we present a model fo...
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R&D culture change – A case study Qual. Eng. (IF 2.0) Pub Date : 2024-02-13 Lynne B. Hare
What follows may be regarded as a part of the unfolding story of the proliferation of statistical engineering and statistical thinking in human endeavors, generally broad but specifically here in i...
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A distribution-free phase II control chart for multivariate individual data with simple post signal diagnostics Qual. Eng. (IF 2.0) Pub Date : 2024-02-13 Chase Holcombe, Mosab Alqurashi, Subhabrata Chakraborti
Multivariate statistical process control (MSPC) charts are particularly useful when there is a need to simultaneously monitor several quality characteristics of a process. Most of the control chart...
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A process capability function approach to multiple response surface optimization based on a posterior procedure Qual. Eng. (IF 2.0) Pub Date : 2024-02-01 In-Jun Jeong, Dong-Hee Lee, Young-Jun Son
Multiple response surface optimization (MRSO) aims to determine a setting of input variables that simultaneously optimizes multiple responses. The process capability function (PCF) approach is an a...
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Grey Duane model for reliability growth prediction under small sample uncertain failure data Qual. Eng. (IF 2.0) Pub Date : 2024-01-23 Lianyi Liu, Sifeng Liu, Wenjie Dong
Traditional reliability growth models require failure data to adhere to a specific distribution, which greatly limits the applicability in data-scarce scenarios. Drawing from the characteristic in ...
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Exploratory image data analysis for quality improvement hypothesis generation Qual. Eng. (IF 2.0) Pub Date : 2024-01-22 Yifei Zhang, Theodore T. Allen, Ramiro Rodriguez Buno
Images can provide critical information for quality engineering. Exploratory image data analysis (EIDA) is proposed here as a special case of EDA (exploratory data analysis) for quality improvement...
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A new approach to risk assessment in failure mode and effect analysis based on engineering textual data Qual. Eng. (IF 2.0) Pub Date : 2024-01-19 Wenyan Song, Jianing Zheng
Failure Mode and Effect Analysis (FMEA) is a valuable tool for improving the quality of products and service systems. However, traditional FMEA methods require examining various engineering textual...
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Editorial for reliability engineering special issue Qual. Eng. (IF 2.0) Pub Date : 2024-01-16 Rong Pan, Lu Lu, Nathaniel Stevens
Published in Quality Engineering (Vol. 36, No. 1, 2024)
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A reliability approach for prediction and management of part obsolescence for improved system health Qual. Eng. (IF 2.0) Pub Date : 2024-01-16 Christina M. Mastrangelo, Kara A. Olson
Accurate prediction of part obsolescence is critical to maintaining system health, especially for the long-lived systems typical in aerospace and naval domains. While there are methods that predict...
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Availability and cost models for sequentially inspected systems with dependent catastrophic and soft failures Qual. Eng. (IF 2.0) Pub Date : 2024-01-16 Amisha Khati, S. B. Singh
This paper introduces a novel availability and cost model designed for competing-risk systems that integrate interdependent catastrophic and soft failures. Catastrophic failures halt system operati...
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Probabilistic modeling of hardware and software interactions for system reliability assessment Qual. Eng. (IF 2.0) Pub Date : 2024-01-16 Alex Davila-Frias, Nita Yodo, Om Prakash Yadav, Phattara Khumprom
An important aspect of complex hardware-software systems reliability is the interaction between hardware and software. Most of the existing work has assumed either independence between hardware (HW...
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Statistical inference in Burr type XII lifetime model based on progressive randomly censored data Qual. Eng. (IF 2.0) Pub Date : 2024-01-16 Rajni Goel, Kapil Kumar, Hon Keung Tony Ng, Indrajeet Kumar
Censoring commonly occurs in real-world scenarios, either intentionally or unintentionally. Unintentional (or accidental) censoring usually happens randomly, i.e., it is out of the experimenters’ c...
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Joint component-system maintenance planning over entire system task profile Qual. Eng. (IF 2.0) Pub Date : 2024-01-16 Yaning Sun, Xiaohong Wang, Lizhi Wang, Rong Pan
Engineering systems have become increasingly complex, which demands the study of system-level maintenance strategy to be integrated with a realistic prediction of component-level performance. Most ...
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A reliability prediction method considering degradation self-acceleration effect in DC-link electrolytic capacitor Qual. Eng. (IF 2.0) Pub Date : 2024-01-16 Xuerong Ye, Qisen Sun, Ruishi Lin, Cen Chen, Min Xie, Guofu Zhai, Rui Kang
The reliability of DC-link electrolytic capacitors is crucial to ensure the quality of power supply systems. The degradation of capacitor parameters may lead to a higher temperature and thus accele...
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Remaining useful life prediction using the similarity-based integrations of multi-sensors data Qual. Eng. (IF 2.0) Pub Date : 2024-01-16 Mohammad Baharshahi, S. Mohammad Seyedhosseini, Shah M Limon
In prognostics and health management, the system’s degradation condition assessment and corresponding remaining useful life prediction are the most important tasks. Both of these processes are heav...
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Optimal design of step-stress accelerated degradation tests based on genetic algorithm and neural network Qual. Eng. (IF 2.0) Pub Date : 2024-01-16 Gen Liu, Zhihua Wang, Rui Bao, Zelong Mao, Kunpeng Ren
In this study, the optimal design of step-stress accelerated degradation tests is focused. An optimization model is proposed where an improved accelerated degradation model is involved to comprehen...
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System reliability optimization with two-sided power distributed component failure times Qual. Eng. (IF 2.0) Pub Date : 2024-01-16 B. Maneckshaw, Kash Barker, G. S. Mahapatra
Many systems connected in series are subject to failure earlier in their design life. The failure rate of such systems has been described by a two-sided power distribution, which enables modeling t...
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Optimal test design for reliability demonstration under multi-stage acceptance uncertainties Qual. Eng. (IF 2.0) Pub Date : 2024-01-16 Bingjie Wang, Lu Lu, Suiyao Chen, Mingyang Li
A reliability demonstration test (RDT) plays a critical role in safeguarding product reliability and making sure it meets the target requirement. When planning an RDT, the test planning parameters ...
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Bayesian analysis of accelerated life test under constrained randomization Qual. Eng. (IF 2.0) Pub Date : 2024-01-16 Shanshan Lv, Fan Li, Guodong Wang, Sen Li
Reliability engineers typically prioritize the lower percentiles. Accurately assessing these lower percentiles enables engineers to delve deeper into early product failures, paving the way for enha...
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Modified Imperfect Repair Model (ARAM1) and new PLP parameterization Qual. Eng. (IF 2.0) Pub Date : 2024-01-11 Tito Lopes, Vera Tomazella, Jeremias Leao, Francisco Louzada
The class of models known as Arithmetic Reduction of Age (ARA) has found widespread use in modeling equipment maintenance data, assuming that the system continuously degrades between failures, as i...
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A Bayesian nonparametric system reliability model which integrates multiple sources of lifetime information Qual. Eng. (IF 2.0) Pub Date : 2024-01-02 Richard L. Warr, Jeremy M. Meyer, Jackson T. Curtis
We present a Bayesian nonparametric system reliability model which scales well and provides a great deal of flexibility in modeling. The Bayesian approach naturally handles the disparate amounts of...
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Utilizing jackknife and bootstrap to understand tensile stress to failure of an epoxy resin Qual. Eng. (IF 2.0) Pub Date : 2023-12-11 R. Caro-Carretero, A. Carnicero, J. R. Jiménez-Octavio, D. Cousineau
A study was conducted on the tensile stress of an epoxy resin (Resoltech® 1050/1056). This was done by gathering a sample of 39 tensile strength data under consistent levels of stress. The tensile ...
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Simultaneous classification and out-of-distribution detection for wafer bin maps Qual. Eng. (IF 2.0) Pub Date : 2023-12-05 Jeongman Choi, Eun-Yeol Ma, Heeyoung Kim
Defect pattern classification of wafer bin maps (WBMs) assists in identifying the causes of semiconductor manufacturing process failures, thus contributing to the search for appropriate solutions. ...
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Mixed-type defect pattern recognition in noisy labeled wafer bin maps Qual. Eng. (IF 2.0) Pub Date : 2023-12-06 Sumin Kim, Heeyoung Kim
In semiconductor manufacturing, classification of defect patterns in wafer bin maps (WBMs) helps engineers detect process failures and identify their causes. In recent studies on WBMs, convolutiona...
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Reliability evaluation of a novel metal oxide-aluminum glycerol film capacitor using nonlinear degradation modeling with dependency considerations Qual. Eng. (IF 2.0) Pub Date : 2023-11-30 Ekene Gabriel Okafor, Xin Wang, Bahktiyar Mohammed Nafis, Andrew Leda, David Ryan Huitink, Xiangbo Meng
Capacitors are components predominantly used to stabilize voltage, store energy, and lower electrical ripples. To improve the flexibility and capacitance of capacitors, we were motivated to develop...
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A note on compositional data gauge R&R studies Qual. Eng. (IF 2.0) Pub Date : 2023-11-16 M. S. Hamada
This article considers measurement system assessment for compositional data, component proportions that sum to one. The data are typically collected from a gauge R&R study, that is, an experiment. ...
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Cause-and-effect diagram-based supersaturated designs Qual. Eng. (IF 2.0) Pub Date : 2023-10-26 Chang-Yun Lin
Supersaturated designs (SSDs) are often used for screening experiments, and cause-and-effect diagrams (CEDs) are useful quality tools that help engineers decide which factors to use in experiments....
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Robust confidence intervals for the process capability index Cpk with bootstrap improvement Qual. Eng. (IF 2.0) Pub Date : 2023-10-06 Linhan Ouyang, Sanku Dey, Chanseok Park
The process capability index (PCI), Cpk, one of the widely used tools for assessing the capability of a manufacturing process, expresses the deviation of the process mean from the midpoint of the s...
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Alternative parameter learning schemes for monitoring process stability Qual. Eng. (IF 2.0) Pub Date : 2023-09-20 Daniele Zago, Giovanna Capizzi
In statistical process control, accurately estimating in-control (IC) parameters is crucial for effective monitoring. This typically requires a Phase I analysis to obtain estimates before monitorin...
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Multi-branch convolutional attention network for multi-sensor feature fusion in intelligent fault diagnosis of rotating machinery Qual. Eng. (IF 2.0) Pub Date : 2023-09-19 Ke Wu, Zirui Li, Chong Chen, Zhenguo Song, Jun Wu
Multi-sensor data fusion approaches based on deep learning are widely used for fault diagnosis of rotating machinery. Massive sensor data bring not only abundant information but also technical chal...
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A hierarchical model-based method for wafer level virtual metrology under process information deficiency Qual. Eng. (IF 2.0) Pub Date : 2023-09-13 Yu-Jun Liu, Dong Ni, Xiong Shao, Dan-Li Gong, Jin-Jin Li
Abstract Online inspection is one of the most critical processes of quality control in semiconductor manufacturing. The physical inspection methods for wafers are time-consuming and unable to achieve wafer level metrology. In order to improve production efficiency and expand inspection coverage, virtual metrology (VM) methods have recently received widespread attention; they utilize process parameters
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Optimal diagnosis interval for online quality control methods Qual. Eng. (IF 2.0) Pub Date : 2023-09-14 Sandeep, Arup Ranjan Mukhopadhyay
Abstract Online quality control methods emphasize manufacturing processes to attain maximum conformance with respect to the specifications of the concerned quality characteristics of a product. One key factor that affects the effectiveness of these methods is the diagnosis interval. In this paper, the existing cost model along with its cost components for online quality control methods has been revisited
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Statistical process control (SPC) for double-bounded information: Choosing wisely the parametric family for unit data Qual. Eng. (IF 2.0) Pub Date : 2023-09-11 Diego C. Nascimento, Oilson A. Gonzatto Junior, David Elal-Olivero, Estefania Bonnail, Paulo H. Ferreira
Abstract This article presents a Statistical Process Control (SPC) framework considering the response process as a unit variable, which demands special treatment. This study designed a Shiny app related to data visualization and inferential estimation adopting SPC charts and Extreme Value Theory. We also proposed a new flexible unit probabilistic model (named FlexShape), which is simple yet overcomes
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Verifying a dominant cause of output variation Qual. Eng. (IF 2.0) Pub Date : 2023-09-11 Mahsa Panahi, Stefan H. Steiner, Jeroen De Mast
Finding the dominant cause(s) of variation in process improvement projects is an important task. Before trying to reduce variation in the dominant cause or mitigate the effect of variation in the d...
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Robust control chart based on mixed-effects modeling framework: A case study in NAND flash memory industry Qual. Eng. (IF 2.0) Pub Date : 2023-09-08 Daewon Yang, Jinsu Park, Hayang Park, Sungki Hong, Jongmin Kim, Seonghui Huh, Eunkyung Kim, Jaeyong Jeong, Yeonseung Chung
Abstract In this research, we analyze the real data in the NAND Flash memory industry using a control chart. There are thousands of electrical measures for each NAND Flash memory chip. We monitor these data through a control chart to ensure that the manufacturing process is in control. For better interpretability, we apply a univariate control chart technique to each variable. However, most existing
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Designing a variables two-plan sampling system with adjustable acceptance criteria for lot disposition Qual. Eng. (IF 2.0) Pub Date : 2023-09-05 Chien-Wei Wu, Ming-Hung Shu, To-Cheng Wang
Abstract The variables acceptance sampling plan and variables acceptance sampling system (VASS) based on process capability indices (PCIs) have gotten greater attention recently because they can efficiently validate product quality in variables measurement scales. In the VASS, the variables quick-switch sampling system (VQSS) and variables tightened-normal-tightened sampling system (VTSS) are the basic
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Sequential Bayesian assurance tests for degradation data Qual. Eng. (IF 2.0) Pub Date : 2023-08-24 Kenneth J. Ryan, Michael S. Hamada, John R. Twist
Measuring degradation of items in a reliability context may be all that is feasible. There may simply be neither enough time nor resources to produce a sufficient number of item failures to charact...
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First to signal criterion for comparing control chart performance Qual. Eng. (IF 2.0) Pub Date : 2023-08-14 Steven E. Rigdon, Nathaniel T. Stevens, James D. Wilson, William H. Woodall
Control chart performance is often measured using average run length or median run length, which gives the expected or median number of samples to signal. It is often argued that on average, one ch...
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Redefining software reliability modeling: embracing fault-dependency, imperfect removal, and maximum fault considerations Qual. Eng. (IF 2.0) Pub Date : 2023-08-08 Umashankar Samal, Ajay Kumar
Abstract Software reliability is a critical aspect of ensuring the quality and dependability of software systems. However, existing software reliability models often make assumptions that do not align with real-world scenarios, such as perfect fault removal and independent faults. In this paper, we address this gap by developing a software reliability model that considers fault-dependent detection
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Hidden dimensions of the data: PCA vs autoencoders Qual. Eng. (IF 2.0) Pub Date : 2023-07-31 Davide Cacciarelli, Murat Kulahci
Principal component analysis (PCA) has been a commonly used unsupervised learning method with broad applications in both descriptive and inferential analytics. It is widely used for representation ...
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Toward a concept of digital twin for monitoring assembly and disassembly processes Qual. Eng. (IF 2.0) Pub Date : 2023-07-26 Elisa Verna, Stefano Puttero, Gianfranco Genta, Maurizio Galetto
Abstract Quality is one of the key factors in the customer’s selection process between competing products. Producing high-quality, defect-free products that meet consumer expectations is crucial for manufacturing companies to gain a competitive advantage. Accordingly, developing appropriate defect generation models is essential in modern manufacturing companies to predict defects and plan efficient
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Monitoring univariate processes using control charts: Some practical issues and advice Qual. Eng. (IF 2.0) Pub Date : 2023-07-26 I. M. Zwetsloot, L. A. Jones-Farmer, W. H. Woodall
Abstract We provide an overview and discussion of some issues and guidelines related to monitoring univariate processes with control charts. We offer some advice to practitioners to help them set up control charts appropriately and use them most effectively. We propose a four-phase framework for control chart set-up, implementation, use, and maintenance. In addition, our recommendations may be useful
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A Bayesian ARMA-GARCH EWMA monitoring scheme for long run: A case study on monitoring the USD/ZAR exchange rate Qual. Eng. (IF 2.0) Pub Date : 2023-07-20 M. Shingwenyana, J.-C. Malela-Majika, P. Castagliola, S. W. Human
Abstract Statistical process monitoring (SPM) offers an important toolkit used to monitor the stability of a process to improve the quality of outputs and/or services. More often, the design of control charts requires the estimation of the probability density function that involves selecting a common distribution that facilitates the estimation of the process parameters. The Bayesian approach is one
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A control chart for monitoring images using jump location curves Qual. Eng. (IF 2.0) Pub Date : 2023-07-10 Anik Roy, Partha Sarathi Mukherjee
Image monitoring is a relatively new research area in statistics and machine learning that has wide applications in various fields including medical diagnostics and subsequently disease monitoring,...
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A latent process approach to change-point detection of mixed-type observations Qual. Eng. (IF 2.0) Pub Date : 2023-06-28 Shuyu Chu, Xueying Liu, Achla Marathe, Xinwei Deng
Mixed-type observations, such as continuous measurements, discrete counts, and binary outcomes, are commonly present in many applications. The change-point detection with mixed-type observations is...
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Optimized control charts using indifference regions Qual. Eng. (IF 2.0) Pub Date : 2023-06-20 Alex Kuiper, Rob Goedhart
In statistical process monitoring, the CUSUM and EWMA control charts have received considerable attention because of their remarkable ability to detect small sustained shifts. In practice, small pr...
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A new multivariate control chart based on the isolation forest algorithm Qual. Eng. (IF 2.0) Pub Date : 2023-06-20 Jing Wang, Liu Liu
Statistical process control (SPC) is an extensively utilized technique in quality management for service and manufacturing industries. Traditional SPC control charts rely on normality assumptions a...
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How generative AI models such as ChatGPT can be (mis)used in SPC practice, education, and research? An exploratory study Qual. Eng. (IF 2.0) Pub Date : 2023-06-16 Fadel M. Megahed, Ying-Ju Chen, Joshua A. Ferris, Sven Knoth, L. Allison Jones-Farmer
Generative Artificial Intelligence (AI) models such as OpenAI’s ChatGPT have the potential to revolutionize Statistical Process Control (SPC) practice, learning, and research. However, these tools ...
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Reevaluating the performance of control charts based on ranked-set sampling Qual. Eng. (IF 2.0) Pub Date : 2023-06-12 William H. Woodall, Abdul Haq, Mahmoud A. Mahmoud, Nesma A. Saleh
Nearly one hundred types of control charts have been proposed that incorporate ranked-set sampling (RSS) methods. The performance of these charts has been evaluated with comparisons to existing cha...
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Evidential FMEA method for human reliability assessment Qual. Eng. (IF 2.0) Pub Date : 2023-05-26 Mei Cai, Jingmei Xiao, Qian Luo, Yu Gao, Xinglian Jian, Ya Wang
Evidence theory is a useful tool for modeling and reasoning uncertain information inherent in experts’ evaluations, which is not handled efficiently in traditional failure mode and effects analysis...
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Flexible, efficient borrowing: A power prior structure for Bayesian interim analysis Qual. Eng. (IF 2.0) Pub Date : 2023-05-19 Victoria R. C. Sieck, Fletcher G. W. Christensen
When making decisions about whether a product can meet required performance standards, it is often of interest to make decisions as soon as enough information has been obtained–even if that is befo...
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The decay of Six Sigma and the rise of Quality 4.0 in manufacturing innovation Qual. Eng. (IF 2.0) Pub Date : 2023-05-18 Carlos A. Escobar, Daniela Macias-Arregoyta, Ruben Morales-Menendez
Smart manufacturing (SM) processes exhibit rapidly increasing complexity, nonlinear patterns in hyperdimensional spaces, high volumes of data, transient sources of variations, reduced lifetime, ult...
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Response to the letter by Professors Woodall and Knoth Qual. Eng. (IF 2.0) Pub Date : 2023-05-17 Nasir Abbas
Published in Quality Engineering (Vol. 35, No. 4, 2023)
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Robust yield test for a normal production process Qual. Eng. (IF 2.0) Pub Date : 2023-05-15 Hamideh Iranmanesh, Mehdi Jabbari Nooghabi, Abbas Parchami
Testing the performance of a production process is a very serious and important topic in statistical quality control. This article presents a robust yield test to investigate the performance of an ...
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Letter to the Editor Qual. Eng. (IF 2.0) Pub Date : 2023-05-12 Sven Knoth, William H. Woodall
Published in Quality Engineering (Vol. 35, No. 4, 2023)