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Manufacturing Technology of OLED Structures. Control of Basic Parameters

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Abstract

The article represents a translated, revised, and updated excerpt from the book Electroluminescent Organic Light-Emitting Diodes Based on Metal Coordination Compounds, Rostov-on-Don: Yuzhn. Fed. Univ., 2015; ISBN 978-5-9275-1469-4 (see Additional Information). The main technological stages for manufacturing of laboratory samples for electroluminescence are described in general terms. The most popular laboratory techniques for the formation of thin semiconducting organic films, such as solution spin coating and vacuum thermal deposition, are considered in more detail. Some methodological approaches used in our laboratory are outlined. Measurements of the polymer layer thickness by the interference method and by atomic force microscopy are considered in detail. For the interference method, the principal sources of systematic errors are examined. Concerning atomic force microscopy (AFM), two techniques for measuring thickness are considered: the express technique (macro-needle scratching) and scratching with an AFM probe in contact mode. Systematic errors associated with the first technique are determined, followed by recommendations regarding its potential application. The last section highlights the necessary adjustment for calibrating thickness sensors during film deposition if the calibration is conducted based on macro-needle scratching results.

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Funding

This study was supported by the Ministry of Science and Higher Education of the Russian Federation within the framework of the state assignment for scientific activity of 2023, no. FENW-2023-0011 (Southern Federal University, Rostov-on-Don) and the state assignment no. 122011300052-1 (Frumkin Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences, Moscow).

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Authors and Affiliations

  1. Frumkin Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences, Moscow, Russia

    S. I. Pozin, E. I. Mal’tsev, D. A. Lypenko, A. V. Dmitriev & A. V. Vannikov

  2. Institute of Physical and Organic Chemistry, Southern Federal University, Rostov-on-Don, Russia

    A. S. Burlov

  3. Research Institute of Physics, Southern Federal University, Rostov-on-Don, Russia

    V. G. Vlasenko

Authors
  1. S. I. Pozin
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  2. E. I. Mal’tsev
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  3. D. A. Lypenko
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  4. A. V. Dmitriev
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  5. A. V. Vannikov
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  6. A. S. Burlov
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  7. V. G. Vlasenko
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Correspondence to V. G. Vlasenko.

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Translated by Z. Svitanko

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ADDITIONAL INFORMATION

The article represents a translated, supplemented, and revised excerpt from the book by A.S. Burlov, V.G. Vlasenko, D.A. Garnovskiy, A.I. Uraev, E.I. Maltsev, D.A. Lypenko, and A.V. Vannikov, Electroluminescent Organic Light-Emitting Diodes Based on Metal Coordination Compounds, Rostov-on-Don: Yuzhn. Fed. Univ., 2015; ISBN 978-5-9275-1469-4. Primarily, this book focuses on metal chelate complexes (Ir, Eu, Tb, Al, and Zn), which are used or considered as prospective additives in the light-emitting layers of OLEDs. Many of the discussed metal complexes were first synthesized and tested in OLEDs with the participation or under the supervision of the authors of the book.

The article is based on Chapter 2 of this book. Section 3, Formation of Organic Layers of OLED Structures from Solutions, has been augmented. Sections 5, Measurement of the Layer Thickness by the Interference Technique, and 6, Quality Control and Surface Thickness Measurement for OLED Structures by Atomic Force Microscopy, have been substantially modified and expanded based on our laboratory’s experience. In Section 5, we added information on the systematic errors of this method has been added. In Section 6, we included examples illustrating the peculiarities of the thickness measurement method using AFM. A comparative analysis of thickness measurement methods described in Sections 5 and 6 was also performed.

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Pozin, S.I., Mal’tsev, E.I., Lypenko, D.A. et al. Manufacturing Technology of OLED Structures. Control of Basic Parameters. Russ J Coord Chem 49 (Suppl 1), S7–S17 (2023). https://doi.org/10.1134/S1070328423600791

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