Abstract

A study on anti-ferroelectric (PbLa)(ZrTi)O₃ (PLZT) for electric vehicles (EV) applicable to DC-link was conducted. Multilayer ceramic capacitors (MLCCs) for DC-link require high-electric field properties and reliability. Oxygen vacancies are a major cause affecting insulation properties and reliability. There are acceptors and donors as methods for controlling the mobility and concentration of oxygen vacancies. The mobility and concentration of oxygen vacancies were simultaneously controlled, rather than individually controlled. Mn⁴⁺ was selected as the acceptor and Dy³⁺ was selected as the donor. After fixing Mn⁴⁺ = 5.0 mol% to (Pb_0.82La_0.12)(Zr_0.86Ti_0.14)O₃, insulation properties and reliability were evaluated according to Dy³⁺ = 5.0, 10.0, 15.0 and 20.0 mol%. A high sintered density was obtained at a temperature of 1200°C in a reduction atmosphere. When Mn⁴⁺ = 5.0 mol% and Dy³⁺ = 10.0 mol% were co-substituted into PLZT, a dielectric constant of about 1800 and a breakdown voltage of about 12 kV mm⁻¹ were obtained. In the co-substituted PLZT, capacitance change and insulation degradation properties were greatly improved. Oxygen vacancy mobility and concentration control were effective in reliability properties. Thermally stimulated depolarization current (TSDC) was analysed to confirm the polarization of oxygen vacancies. TSDC increased with electric field and time. TSDC decreased in co-substituted PLZT compared to un-substituted PLZT. A factor affecting TSDC is the behaviour of oxygen vacancies. Based on the result, the oxygen vacancies are polarized and moved by the application of an electric field, resulting in degradation of insulating properties.

中文翻译：

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氧空位对EV-MLCC反铁电PLZT介电性能和可靠性的影响

摘要

对适用于直流母线的电动汽车(EV)反铁电(PbLa)(ZrTi)O ₃ (PLZT)进行了研究。用于直流母线的多层陶瓷电容器 (MLCC) 需要高电场特性和可靠性。氧空位是影响绝缘性能和可靠性的主要原因。有受体和供体作为控制氧空位的迁移率和浓度的方法。氧空位的迁移率和浓度是同时控制的，而不是单独控制的。选择Mn ⁴⁺作为受体，选择Dy ³⁺作为供体。将Mn ⁴⁺＝5.0摩尔％固定于(Pb _0.82 La _0.12 )(Zr _0.86 Ti _0.14 )O ₃后，按照Dy ³⁺＝5.0、10.0、15.0、20.0摩尔％评价绝缘性和可靠性。在还原气氛中、1200℃的温度下获得了高烧结密度。当将Mn ⁴⁺＝5.0mol％和Dy ³⁺ ＝10.0mol％共置换到PLZT中时，获得约1800的介电常数和约12kVmm ^-1的击穿电压。在共取代PLZT中，电容变化和绝缘劣化性能得到极大改善。氧空位迁移率和浓度控制对可靠性性能有效。分析热刺激去极化电流（TSDC）以确认氧空位的极化。 TSDC随着电场和时间的增加而增加。与未取代的 PLZT 相比，共取代的 PLZT 中的 TSDC 降低。影响 TSDC 的一个因素是氧空位的行为。根据该结果，通过施加电场，氧空位被极化并移动，导致绝缘性能下降。