当前位置: X-MOL 学术Eur. Phys. J. Plus › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Errors and losses impact on planar integrated photonic circuits fidelity
The European Physical Journal Plus ( IF 3.4 ) Pub Date : 2024-03-21 , DOI: 10.1140/epjp/s13360-024-05070-w
Wilder R. Cardoso

Abstract

Every manufacturing or synthesis process suffers from possible errors or inaccuracies. Thus, this article presents a theoretical study on how such imperfections affect the efficiency of an planar integrated photonic circuit. Three sources of error were analyzed: absorption and scattering phenomena, inaccuracies in the directional couplers physical dimensions and uncertainties in the phase shifters implementation. As a result, graphs that indicate the behaviour of the photonic circuit efficiency, described by a quantity called fidelity, in function of the source of errors were obtained. These graphs allow to deduce scenarios where, even under the action of such imperfections, its fidelity still presents high values.



中文翻译:

误差和损耗对平面集成光子电路保真度的影响

摘要

每个制造或合成过程都可能存在错误或不准确。因此,本文提出了关于此类缺陷如何影响平面集成光子电路效率的理论研究。分析了三个误差源:吸收和散射现象、定向耦合器物理尺寸的不准确以及移相器实现的不确定性。结果,获得了指示光子电路效率行为的图表,该效率由称为保真度的量来描述,与误差源的函数关系。这些图表可以推断出即使在此类缺陷的作用下,其保真度仍然呈现高值的场景。

更新日期:2024-03-21
down
wechat
bug